Search results

1 – 1 of 1
Article
Publication date: 1 December 1995

Michael Yaccino and James Maynard

Examines a way to dramatically reduce the number of tests it takes toqualify a vision inspection system [VIS] which carries out attributeinspections by applying a statistical…

182

Abstract

Examines a way to dramatically reduce the number of tests it takes to qualify a vision inspection system [VIS] which carries out attribute inspections by applying a statistical operation called a binomial distribution. Describes a binomial distribution and looks at its employment in manufacturing terms. Outlines how a conventional inspection system works and compares the two techniques. Concludes that the advantages of using a binomial distribution include a reduced number of tests, a reduction in equipment cost and the technique is simple to understand and perform.

Details

Assembly Automation, vol. 15 no. 4
Type: Research Article
ISSN: 0144-5154

Keywords

1 – 1 of 1