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This paper seeks to review recent advances in wire bonding, flip chip and lead‐free solder for advanced microelectronics packaging.

Of the 91 journal papers, 59 were published in 2005‐2007 and topics related to wire bonding, flip chip and lead‐free solder for advanced microelectronics packaging are reviewed.

Research on advanced wire bonding is continuously performed for advanced and complex applications such as stacked‐dies wire bonding, wire bonding of low‐k ultra‐fine‐pitch devices, and copper wire bonding. Owing to its many advantages, flip chip using adhesive has gained more popularity. Research on the reliability of lead‐free solder joints is being conducted world‐wide. The new challenges, solutions and new developments are discussed in this paper.

Because of page limitation of this review paper and the large number of the journal papers available, only a brief review is conducted. Further reading is needed for more details.

This review paper attempts to provide introduction to recent developments and the trends in terms of the topics for advanced microelectronics packaging. With the references provided, readers may explore more deeply, focusing on a particular issue.

Optical profilometry has many industrial uses, from machine tool measurements to microelectronics, as experts explain.

Proper thermal management is a key to improve the efficiency and reliability of light-emitting diodes (LEDs). This paper aims to report the influence of applying thermally conductive materials on thermal performance of indium gallium aluminum phosphide (InGaAlP)-based thin-film surface-mounted device (SMD) LED.

The LED thermal and optical parameters were determined using the combination of thermal transient tester (T3Ster) and thermal and radiometric characterization of power LEDs (TeraLED) instruments. The LED was mounted on FR4, 2W and 5W aluminum (Al) package substrates. Measurements were carried out by setting different boundary conditions: air between LED package and substrate and using thermally conductive epoxy (TIM A) and adhesive (TIM B) of thermal conductivity 1.67 and 1.78 W/mK, respectively.

For LED mounted on FR4 package, the total real thermal resistance is improved because of TIM B by 6 and 9 per cent at 50 and 100 mA, respectively. Likewise, the relative decrease in total thermal resistance of LED on 2W Al package is about 9 and 11 per cent. As well, for LED mounted on 5W Al package, the total real thermal resistance is reduced by 2 and 4 per cent.

No much work can be found in the literature on thermal interface material effects on thermal performance of low-power SMD LED. This work can assist in thermal management of low-power LEDs.

Thermal behavior of light-emitting diode (LED) device under different operating conditions must be known to enhance its reliability and efficiency in various applications. The purpose of this study is to report the influence of input current and ambient temperature on thermal resistance of InGaAlP low-power surface-mount device (SMD) LED.

Thermal parameters of the LED were measured using thermal transient measurement via Thermal Transient Tester (T3Ster). The experimental results were validated using computational fluid dynamics (CFD) software.

As input current increases from 50 to 90 mA at 25°C, the relative increase in LED package (ΔR_thJS) and total thermal resistance (ΔR_thJA) is about 10 and 4 per cent, respectively. In addition, at 50 mA and ambient temperature from 25 to 65°C, the ΔR_thJS and ΔR_thJA are roughly 28 and 22 per cent, respectively. A good agreement between simulation and experiment results of junction temperature.

Most of previous studies have focused on thermal management of high-power LEDs. There were no studies on thermal analysis of low-power SMD LED so far. This work will help in predicting the thermal performance of low-power LEDs in solid-state lighting applications.

Thermal issues are becoming increasingly serious with the scaling down of integrated circuits and the increasing density brought in by advanced packaging techniques. Consequently, thermal issues need to be considered during both design and test. The present paper addresses thermal testing, and more specifically thermal transient testing.

The presence of voids in the solder layer has been considered as one of the main issues causing reliability problems in optoelectronic devices. Voids can be created due to trapped gas, clean-up agent residues (fluxes), poor wettability at interface or shortcoming of the reflow process. The voids hinder the heat conduction path and subsequently, the thermal resistance will increase. The purpose of this paper is to investigate the influence of lead-free water-washable Sn96.5Ag3.0Cu0.5 (SAC305) solder paste (SP) voids on the thermal and optical performance of white high-power (HP) surface-mounted device (SMD) light-emitting diode (LED).

Five LEDs are mounted on five SinkPAD substrates by using the SP. The SMT stencil printing is used to control the thickness of the SP and reflow oven for the soldering process. The fraction of voids in the SP layer is calculated using the X-ray machine software. The thermal parameters of the LEDs with different voids fraction and configuration are measured using a thermal transient tester (T3Ster) system. In addition, the optical characterizations of the LEDs are determined by the thermal and radiometric characterization of power LEDs (TeraLED) and the electroluminescence by using the spectrometer.

The results showed that the thermal performance and temperature distribution are improved for the LED with lower voids fraction and good filling state of soldering. In addition, luminous flux, efficacy and color shift of the LEDs with different fraction and configurations of voids on the SP layer are compared and discussed. It is found that the color shift of LED1 of low voids fraction and higher thickness are less than other LEDs.

The paper provides valuable information about the effect of water-washable SAC305 SP voids fraction and filling state of solder on the thermal and optical performance of ThinGaN HP SMD LED. A comprehensive overview of the outcomes is not available in the literature. It was shown experimentally that the voids fraction, height and configuration of the SP layer could strongly influence the heat dissipation efficiency and thermal resistance. This study can help in heat diffusion investigation and failure analysis of HP SMD LEDs.

The purpose of this paper is to present the results of experiments performed to attach silicon dies (chips) to low‐temperature co‐fired ceramic (LTCC) substrates with Ag or AgPd pads using SnAgCu or SnPb solder and the results of the characterization of the solder joints.

LTCC substrates were fabricated by stacking and laminating four green tapes with the top layer screen‐printed with Ag or AgPd paste to form pads. Silicon die sizes of 1 × 1 mm and 2 × 2 mm with electroless nickel immersion gold plated were soldered to 2 × 2 mm pads on the LTCC substrates using SnPb or SnAgCu solder. The solder joints were then characterized using X‐ray, die shear, energy dispersive X‐ray and scanning electron microscopy techniques.

The joints made by AgPd pads with SnAgCu solder provided the best results with the highest shear strength having strong interfaces in the joints. However, the joints of Ag pads with SnPb solder did not provide high‐shear strength.

The findings provide certain guidelines to implement LTCC applications. AgPd pads with SnAgCu solder can be considered for applications where small silicon dies need to be attached to LTCC substrates. However, Ag pads with SnAgCu solder can be considered for lead‐free solder applications.