Search results

Aims to evaluate different thick‐film materials for use in strain sensors and temperature sensors on low‐temperature co‐fired ceramic (LTCC) substrates.

LTCC materials are sintered at the low temperatures typically used for thick‐film processing, i.e. around 850°C, The thick‐film resistor materials for use as strain and temperature sensors on LTCC tapes are studied. Thick‐film piezo‐resistors in the form of strain‐gauges are realised with 10 kΩ/sq. 2041 (Du Pont)and 3414‐B (ESL), resistor materials; thick‐film temperature‐dependent resistors were made from PTC 5093 (Du Pont), and NTC‐4993 (EMCA Remex) resistor materials.

The X‐ray spectra of the 2041 and 3414‐Bb low TCR resistors after drying at 150°C and after firing display more or less the same peaks. The electrical characteristics of 2041 resistors fired on alumina and LTCC substrates are similar indicating that the resistors are compatible with the LTCC material. After firing on LTCC substrates the sheet resistivities and TCRs of the 3414‐B resistors increased. Also, there is a significant increase in the GFs from 13 to over 25.

Investigates the compatibility of thick‐film materials and the characteristics of the force and temperature sensors.

Pressure‐sensor miniaturization requires high‐density packaging. This means that designers are constantly faced with all kinds of challenging, and sometimes impossible, requirements. In this paper we will present three examples with specific technologies and aspects of miniaturization and packaging. The first example is a pressure switch, the second a pressure sensor and the third a smart pressure sensor.

Silicon piezoresistive pressure sensor dies are mounted on a ceramic substrate where the signal conditioning electronics are implemented in thick film technology. In this paper some of these techniques, e.g. special attachment and bonding requirements, methods for temperature compensation, the principles of parameter adjustment, and encapsulation, are presented. For illustration two examples are described. The first is a multipoint monitoring system with 720 measuring points in a test mattress. The second example is a family of industrial pressure transducers.

Strain gauges can be realised by printing and firing thick‐film resistors on ceramic substrates that are usually based on alumina. However, sensing elements made on some other substrates – tetragonal zirconia or stainless steel – would exhibit some improved characteristics, either due to a lower modulus of elasticity or a higher mechanical strength. As thick‐film resistors are developed for firing on alumina substrates their compatibility and possible interactions with other kinds of substrates have to be evaluated. The sheet resistivities and noise indices of the resistors were comparable, whereas the gauge factors were lower for the dielectric‐on‐steel substrates. The temperature coefficients of resistivity (TCR) of the resistors on the ZrO₂ and dielectric‐on‐steel substrates were higher than the TCRs on the alumina substrates, which was attributed to the higher thermal expansion coefficient of the tetragonal zirconia and the stainless steel.

Diffusion patterning is a dielectric patterning technology, which is used in the screen printed thick film technology for higher density multilayer circuits. This technology is suitable for producing lower cost multichip modules and requires a low additional investment in conventional thick film technology production lines. Comparisons of via resolution capability of diffusion patterning versus conventional thick film technology are described and discussed. Preliminary experimental results obtained with a test circuit showed that 200μm lines and 200μm vias could be achieved with acceptable yield and with minimal modification to standard production lines. The electronic circuit for the pressure sensor was designed and realised with the verified technology as a low‐cost ceramic multichip module. A few results of an investigation of some thick film materials, which comprise the “set” of pastes for diffusion patterning technology, are presented.

The purpose of this paper is to present the research activity and results to research and development society on the field of ceramic microsystems.

The chemical reactor was developed as a non-conventional application of low temperature co-fired ceramic (LTCC) and thick-film technologies. In the ceramic reactor with a large-volume, buried cavity, filled with a catalyst, the reaction between water and methanol produces hydrogen and carbon dioxide (together with traces of carbon monoxide). The LTCC ceramic three-dimensional (3D) structure consists of a reaction chamber, two inlet channels, an inlet mixing channel, an inlet distributor, an outlet collector and an outlet channel. The inlet and outlet fluidic barriers for the catalyst of the reaction chamber are made with two “grid lines”.

A 3D ceramic structure made by LTCC technology was successfully designed and developed for chemical reactor – methanol decomposition.

Research activity includes the design and the capability of materials and technology (LTCC) to fabricate chemical reactor with large cavity. But further dimensions-scale-up is limited.

The technology for the fabrication of LTCC-based chemical reactor was developed and implemented in system for methanol decomposition.

The approach (large-volume cavity in ceramic structure), which has been developed, can be used for other type of reactors also.

In this manuscript the purpose is to present and evaluate the developed non‐destructive method for analysing the phase composition of LTCC Du Pont “Green Tape 951” material fired in the temperature range from 800 to 1,000°C using X‐ray powder diffraction and Rietveld refinement.

The method uses the crystalline Al2O3 which is already present in the material as an internal standard since its mass fraction was previously found to be constant in the described temperature range.

The results of the non‐destructive analyses and the classical destructive analyses are comparable and the estimated error of the destructive phase analyses and the calculated errors for the non‐destructive phase analyses are of the same order.

The described method can be used also for analysing another type of LTCC material. In this case it is necessary to check whether the mass fraction of any crystalline phase present in the sample is constant in the given temperature range, because only in this case can it be used as an internal standard for a determination of the phase composition.

The non‐destructive method is a fast and easy approach for analysing the fired samples and is also suitable for controlling the phase composition of LTCC materials on 3D complex structures without destroying them, just by using the X‐ray diffraction patterns collected from their surface.

The opportunity for mutual benefit across Europe to develop low‐cost MCM technologies arose from recognition of the scientific skills and design and prototyping capabilities in organic and inorganic circuits in countries of Central Europe. As a result, the leading research institutions and small/medium‐size enterprises of Hungary, Romania and Slovenia together with relevant institutions of the UK and Belgium proposed and received approval for a European Union INCO‐Copernicus project “Cheap multichip models” to establish fast prototyping low cost multichip module (MCM) technology facilities. The project commenced in May 1997.