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In the past 15 years stretchable electronic circuits have emerged as a new technology in the domain of assembly, interconnections and sensor circuits and assembly technologies. In the meantime a wide variety of processes with the use of many different materials have been explored in this new field. The purpose of the current contribution is for the authors to present an approach for stretchable circuits which is inspired by conventional rigid and flexible printed circuit board (PCB) technology. Two variants of this technology are presented: stretchable circuit board (SCB) and stretchable mould interconnect (SMI).

Similarly as in PCB 17 or 35 μm thick sheets of electrodeposited or rolled‐annealed Cu are structured to form the conductive tracks, and off‐the‐shelf, standard packaged, rigid components are assembled on the Cu contact pads using lead‐free solder materials and reflow processes. Stretchability is obtained by shaping the Cu tracks not as straight lines, like in normal PCB design, but as horseshoe shaped meanders. Instead of rigid or flexible board materials, elastic materials, predominantly PDMS (polydimethylsiloxane), are used to embed the conductors and the components, thus serving as circuit carrier. The authors include some mechanical modeling and design considerations, aimed at the optimization of the build‐up and combination of elastic, flexible and rigid materials towards minimal stress and maximum mechanical reliability in the structures. Furthermore, details on the two production processes are given, reliability findings are summarised, and a number of functional demonstrators, realized with the technologies, are described.

Key conclusions of the work are that: supporting the metal meanders with a flexible carrier prior to embedding in an elastic substrate substantially increases the reliability under mechanical stress (cyclic uniaxial stretching) of the stretchable interconnect and the transition areas between rigid components and stretchable interconnects are the zones which are most sensitive to failure under mechanical stress. Careful design and technology implementation is necessary, providing a gradual transition from rigid to flexible to stretchable parts of the circuit.

Technologies for stretchable circuits, with the same level of similarity to standard PCB manufacturing and assembly, and thus with the same high potential for transfer to an industrial environment and for mass production, have not been shown before.

As the demand for flip‐chip products increases, the need for low cost high volume manufacturing processes also increases. Currently solder paste printing is the wafer bumping method of choice for device pitches down to 150‐200μm. However, limitations in print quality and stencil manufacture mean that this technology is not likely to move significantly below this pitch and new methods will be required to meet the demands predicted by the technology roadmaps. This paper describes experiments conducted on carriers made from silicon for bumping of die using solder paste. An anisotropic etching process was used to generate pockets in the silicon surface into which solder paste was printed. Die were then placed against the carrier and reflowed to transfer the solder directly to the bondpads. An assessment was carried out of the potential application and limitations of this technique for device pitches at 225 and 127μm.

The purpose of this paper is to present an update on the progress of the design and reliability of stretchable interconnections for electronic circuits.

Finite element modelling (FEM) is used to analyse the physical behaviour of stretchable interconnects under different loading conditions. The fatigue life of a copper interconnect embedded into a silicone matrix has been evaluated using the Coffin‐Manson relation and FEM.

The mechanical properties of the substrate and the design of the metal interconnection play an important role on the fatigue lifetime of circuit. In the case of copper embedded into a PDMS Sylgard 186, more than 2,500 tensile cycles have been observed for a periodic deformation of 10 per cent.

Reliability results are limited and need further work to create a more accurate empirical model to estimate the lifetime of stretchable interconnections.

The combined use of FEM and experimental analysis enable a more reliable design of the stretchable metal interconnections. The proposed horseshoe design offers the benefit of reduced permanent damage during elongation.

The aim of this work is to investigate the decomposition behaviour of the activator species commonly used in the wave solder no-clean flux systems and to estimate the residue amount left after subjecting the samples to simulated wave soldering conditions.

Changes in the chemical structure of the activators were studied using Fourier transform infrared spectroscopy technique and were correlated to the exposure temperatures within the range of wave soldering process. The amount of residue left on the surface was estimated using standardized acid-base titration method as a function of temperature, time of exposure and the substrate material used.

The study shows that there is a possibility of anhydride-like species formation during the thermal treatment of fluxes containing weak organic acids (WOAs) as activators (succinic and DL-malic). The decomposition patterns of solder flux activators depend on their chemical nature, time of heat exposure and substrate materials. Evaporation of the residue from the surface of different materials (laminate with solder mask, copper surface or glass surface) was found to be more pronounced for succinic-based solutions at highest test temperatures than for adipic acid. Less left residue was found on the laminate surface with solder mask (∼5-20 per cent of initial amount at 350°C) and poorest acid evaporation was noted for glass substrates (∼15-90 per cent).

The findings are attributed to the chemistry of WOAs typically used as solder flux activators. The results show the importance WOA type in relation to its melting/boiling points and the impact on the residual amount of contamination left after soldering process.

The results show that the evaporation of the flux residues takes place only at significantly high temperatures and longer exposure times are needed compared to the temperature range used for the wave soldering process. The extended time of thermal treatment and careful choice of fluxing technology would ensure obtaining more climatically reliable product.