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A variety of lead‐free solders are now commercially available. Of those suitable for mass soldering perhaps the ones closest to a direct, drop‐in, replacement for tin‐lead are the tin‐zinc‐bismuth alloys. For most tin‐based solders it is the tin which is the active element and dominates the all‐important interfacial reactions. As a result they have many properties in common. The addition of zinc, however, radically alters this picture. Zinc oxidation products are formed at the surfaces. Zinc intermetallic compounds are also formed in preference to tin‐compounds at the substrate interfaces. The nature and implications of these changes are outlined for the common basis materials.

The purpose of this study was to examine the influence of adding a small amount of Ti to a Cu-based alloy, specifically the commercial Hyper Titanium Copper alloy (C1990 HP), which contains Cu-3.28 wt.% Ti, on its interfacial reaction with Sn-9.0 wt.% Zn (SnZn) solder, using the liquid/solid reaction couple technique.

The SnZn/C1990 HP couples were subjected to a reaction temperature of 240–270°C for a duration of 0.5–5 h. The resulting reaction couple was characterized using a scanning electron microscope, energy dispersive spectrometer, electron probe microanalyzer and X-ray diffractometer.

It was observed that the scallop-shaped CuZn5 and planar Cu5Zn8 phases were formed in almost all SnZn/C1990 HP couples. With increased reaction duration and temperature, the Cu-rich intermetallic compound (IMC)-Cu5Zn8 phase became a dominant IMC formed at the interface. The total thickness of the IMCs was increased with the increase in the reaction duration and temperature. The IMC growth obeyed the parabolic law, and the IMC growth mechanism was diffusion controlled. The activation energy of the SnZn/C1990 HP couple was 64.71 kJ/mol.

This article presents an analysis of the IMC thickness in each sample using ImageJ software, followed by kinetic analysis using Origin software at various reaction temperatures of SnZn/C1990 HP in liquid/solid couples. The study also includes detailed reports on the morphology, interface composition and X-ray diffraction analysis, as well as the activation energy. The findings can serve as a valuable reference for electronic packaging companies that utilize C1990 HP substrates.

A study was performed which investigated the wettability of 63Sn‐37Pb and 96.5Sn‐3.5Ag solders on copper and gold ‐nickel plated Kovar ™ using a rosin ‐based, mildly activated (RMA) flux, a water soluble organic acid flux (WS ),and a low residue (LR) flux. The quantitative metric was the contact angle, θ_c, measured by the meniscometer /wetting balance technique. The first part of the study (Part 1) examined wetting performance following continuous exposure to 25°C prior to testing. Then, a preheating step was introduced into the experimental procedure after flux application, but preceding the actual wettability test in order to simulate a factory reflow process; these results are presented in Part II of this study. Contact angles for the 63Sn‐37Pb solder (215°C) on copper were 22±2° with the RMA flux, 12±5° for the WS flux, and 31±6° for the LR flux. Increasing the 63Sn‐37Pb solder temperature to 245°C improved wettability with the RMA and LR fluxes, but no change was observed with the WS fulx. Theii 96.5Sn‐3.5Ag lead ‐free solder exhibited poorer wettability on copper compared with the 63Sn‐37Pb alloy, with contact angles of 41±2° (RMA), 63±15°(WS) and 39±4°(LR). For the gold ‐nickel plated Kovar™ substrates, the 63Sn‐37Pb solder at 215° had contact angles of 15±3°, 35±6° and 29±6° for the RMA, WS and LR fluxes, respectively. The values were reduced at the higher test temperature (245°). The 96.5Sn‐3.5Ag solder also exhibited good wetting performance on the gold ‐nickel plated Kovar™ specimens compared with copper. Analysis of the interfacial tension parameters, γ_SF‐γ_SLand γ_LF ,exemplified the importance of γ_LF as well as the condition of the surfaces (γ_SF ) on wettability performance. A so ‐called ‘combined analysis’ of the 63Sn‐37Pb and 96.5Sn‐3.5Ag wettability data on either copper or gold ‐ nickel plated Kovar™ substrates was used to predict the solder temperature dependence of wettability for the three fluxes and two base materials.

Most of the electronics packaging materials, especially solders, are temperature dependent. Their temperature‐dependent material properties can be obtained by TMA (thermal mechanical analysis), DMA (dynamic mechanical analysis), DSC (differential scanning calorimetry), and TGA (thermogravimetric analysis). In this study, the thermal coefficient of expansion (TCE), storage modulus, moisture uptake, and melting point of two lead free solders, 96.5wt%Sn‐3.5wt%Ag and 42wt%Sn‐58wt%Bi provided from two different vendors, are measured by, respectively, TMA, DMA, TGA, and DSC. For comparison purpose, the 63wt%Sn‐37wt%Pb solder is also considered.

To investigate the relationship between intermetallic compound (IMC) formation and solderability for immersion tin deposit under different number of reflows.

Scanning Auger microscopy and X‐ray photoelectron spectrometer surface analysis techniques were used to study changes in immersion tin deposit layer when subjected to simulated solder reflow conditions.

Auger analysis also showed that no three discrete uniform layers of pure tin, Cu₆Sn₅η‐phase and Cu₃Sn ε‐phase can be observed after one reflow. Degradation in solderability performance after reflow was due to the formation of a Cu₆Sn₅ IMC at the surface. This IMC has inferior solder wetting properties compared to tin. As the number of reflow cycles increases the surface contains less tin rich regions and more IMC regions. Experiments showed that longer reflow times during the assembly process or use of a thicker tin layer can improve the solderability after three reflow cycles.

This work has shown that longer reflow times during the assembly process or use of a thicker tin layer can improve solderability after three reflow cycles. These two approaches are thus recommended when using immersion tin finishes on PCBs that require multiple lead‐free reflow cycles.

This paper provides valuable data that will assist PCB assemblers to optimise their solder reflow conditions when assembling boards that require multiple solder cycles.

To evaluate the oxide formation characteristics of tin (Sn) as a function of conditioning treatment and define a conditioning methodology that rapidly produces a tin oxide thickness and oxide species morphology similar to those formed in ambient oxidation.

Electrochemical reduction analysis and scanning electron microscopy techniques were utilized to identify tin oxide species and oxide quantities on tin samples which were subjected to a variety of conditioning methodologies.

Tin oxide species were identified and oxide quantities measured. Comparisons of tin oxide species/quantities were completed for the different conditioning methodologies used and for other industry oxide investigations. The following conclusions were reached: all conditioning methodologies produced both SnO and SnO₂ tin oxide species; steam conditioning produced the thickest oxides; the conditioning methodologies investigated were found to produce oxide thicknesses similar to those formed under ambient conditions.

Further investigation would be beneficial using this study as a foundation. Additional conditioning methodologies and a larger selection of various tin surfaces would provide a future understanding of the impact of oxide species and thickness on solderability.

The electronics industry has attempted to “predict” a surface's susceptibility to oxidation by using accelerated conditioning techniques. An understanding of the formation of tin oxidation products created by accelerated conditioning techniques could be highly beneficial to the electronics industry. The standardization and use of a realistic accelerated conditioning technique would reduce testing cycle time, increase the predictability and consistency of test results, and lower testing costs.

This paper was incorporated into an original electronics manufacturer's solderability testing/analysis procedures, and the results are being utilized by the electronics industry solderability specification task groups/committees.

The purpose of this paper is to investigate the oxidation behaviour of an immersion tin final finish after multiple reflow ageing under air and nitrogen atmospheres and to study their influence on the wetting behaviour with lead‐free solder. To design a model that describes the degradation of wetting behaviour after reflow‐cycling of the immersion tin final finish.

A special printed circuit boards (PCB) demonstrator was created to investigate the immersion tin final finish with surface analysis methods and wetting tests. The PCB samples were aged by multiple reflow‐cycling under air and nitrogen atmospheres. The tin oxide formation behaviour of immersion tin was characterised using X‐ray photoelectron spectroscopy (XPS), transmission electron microscope (TEM) and SERA analysis.

The native oxide layer of the investigated immersion tin final finishes was approximately 7 nm on average. The TEM and XPS investigations indicated an amorphous structure of SnO and SnO₂. The solder spread test showed significantly different results for PCBs in “as received” condition compared to those after one and two times reflow ageing under a nitrogen solder atmosphere. The analysis methods revealed a slight increase in the tin oxide layer thickness and small areas with semi‐crystalline structure. Reflow ageing under an ambient solder atmosphere induced considerably thicker oxide layers, which could be observed by a yellow discoloration of the surface.

Measures to improve the wetting behaviour can be derived from the described model (i.e. use of higher tin layer thickness or protective films to reduce the tin oxidation).

A functional model for the solderability process of lead‐free solder on immersion tin PCB final finishes was derived and verified. By this, interactions between the state of the final finish and the solder can be described and potential solderability failures can be predicted.

The goal of this work is to evaluate the feasibility of soldering tin‐silver‐copper balled BGAs using tin‐lead‐based solder and to investigate the influence of different production parameters on the microstructure of the solder joint.

The soldering of the BGAs was done with various temperature profiles and two conveyor speeds under a nitrogen atmosphere in a full convection oven. One specimen from each temperature/time combination was cross‐sectioned. The cross sections were analysed with optical microscopy, scanning electron microscopy with energy dispersive X‐ray spectroscopy (SEM/EDS) at 30 kV and focused ion beam microscopy (FIB).

The cross sections show a metallurgical bond between the solder and the tin‐silver‐copper balls of the BGA, even at a peak reflow temperature of 210°C. However, the balls alloy only partially with the solder, as the liquidus of tin‐silver‐copper balls is 217°C. As soon as the peak temperature exceeds the liquidus of the ball, the solder is totally dissolved in the material of the ball. A reflow profile with a peak temperature of about 230°C on the BGA gives a homogenous reaction of the solder with the ball with a minimum formation of voids.

The dependence of varying reflow parameters on reliability requires detailed study. Especially the effect of a partially melted ball on the degradation of the solder joint needs to be investigated.

From the findings, it can be said that soldering lead‐free balls with tin‐lead solder is possible. This is useful during the transitional period that the industry is in at the moment. More and more component manufacturers are changing their components to lead‐free, often without notice to the customer. If a production line is still running a tin‐lead process it is essential to know how to process these components with tin‐lead solder.

A test procedure was developed to assess the capillary flow wettability of solders inside a confined geometry. The test geometry comprised two parallel plates with a controlled gap of constant thickness (0.008 cm, 0.018 cm, 0.025 cm and 0.038 cm). Capillary flow was assessed by: (1) the meniscus or capillary rise of the solder within the gap; (2) the extent of void formation in the gap; and (3) the time dependence of the risen solder film. Tests were performed with the lead‐free solders 95Sn‐5Sb, 96.5Sn‐3.5Ag, and 91.84Sn‐3.33Ag‐4.83Bi. The capillary rise of the lead‐free solders was less than that observed with the 63Sn‐37Pb control. Reducing the solder surface tension and contact angle improved capillary flow. Void formation by the non lead solders increased as the gap became smaller. The extent of voiding was determined primarily by the gap size rather than the wettability parameters (contact angle or surface tension) of the individual alloys.

This study aims to review the effect of copper percentage in Sn-based solder alloys (Sn-xCu, x = 0–5 Wt.%) on intermetallic compound (IMC) formation and growth after laser soldering.

This study reviews the interfacial reactions at the solder joint interface, solder joint morphology and the theory on characterizing the formation and growth of IMCs. In addition, the effects of alloying and strengthening mechanism, including wettability, melting and mechanical properties are discussed.

This paper presents a comprehensive overview of the composition of tin-copper (Sn-Cu) solders with a potential to enhance their microstructure, mechanical characteristics and wettability by varying the Cu percentage. The study found that the best Cu content in the Sn-xCu solder alloy was 0.6–0.7 Wt.%; this composition provided high shear strength, vibration fracture life value and ideal IMC thickness. A method of solder alloy preparation was also found through powder metallurgy and laser soldering to improve the solder joint reliability.

This study focuses on interfacial reactions at the solder joint interface, solder joint morphology, modelling simulation of joint strength and the theory on characterising the formation and growth of IMC.

The paper comprehensively summarises the useful findings of the Sn-Cu series. This information will be important for future trends in laser soldering on solder joint formation.