Search results

This paper aims to identify a variety of binary system solders by alloying, and relevantly derive multiple system Pb-free solders from the former, attempting to replace the high temperature Sn-Pb solder.

The basis of the paper is the synthesis of previous studies. In terms of some binary high temperature solder alloys, such as Au-20Sn, Bi-2.5Ag, Sn-5Sb, Au-12.5Ge, Zn-6Al and Zn-Sn, taking the alloy phase diagram as the starting point, the melting characteristics, microstructure, mechanical properties, wetting ability and reliability of solder joint are analysed and the prospect is consequently indicated.

Based on the analysis of the six groups of Pb-free solders, the present binary system solder alloys, from the perspective of melting properties, mechanical properties, soldering or reliability of solder joint, rarely meet the comprehensive requirements of replacing the high-temperature Sn-Pb solder. It is assumed to be a solution that multiple-system Pb-free solders derive from a variety of binary system solders by means of alloying. The future development of high temperature Pb-free solder may focus on some factors such as physical properties, mechanical properties, processing, reliability of solder joint, environmental performance and expense.

The paper concentrates on the issue of Pb-free solders at high temperature. From a specific perspective of binary system solders, the presently available Pb-free solders are suggested from the starting point of the alloy phase diagram and the prospect of alternatives of Sn-Pb solders at high temperature are indicated.

A reflow profile is proposed which is engineered to optimize soldering performance based on defect mechanism analysis. In general, a slow ramp‐up rate is desired in order to minimize hot slump, bridging, tombstoning, skewing, wicking, opens, solder beading, solder balling, and components cracking. A minimized soaking zone reduces voiding, poor wetting, solder balling, and opens. Use of a low peak temperature lessens charring, delamination, intermetallics, leaching, dewetting, and voiding. A rapid cooling rate helps to reduce grain size as well as intermetallic growth, charring, leaching and dewetting. However, a slow cooling rate reduces solder or pad detachment. The optimized profile favors that the temperature ramps up slowly until reaching about 180°C. Implementation of the optimized profile requires the support of a heating‐efficient reflow technology with a controllable heating rate. Emergence of the forced air convection reflow provides a controllable heating rate. In addition, it is not sensitive to variation in parts’ features, thus allows the realization of the optimized profile.

This study aims to study the impact of intermetallic compound on microstructure, mechanical characteristics and thermal behavior of the melt-spun Bi-Ag high-temperature lead-free solder.

In this paper, a new group of lead-free high-temperature Pb-free solder bearing alloys with five weight percentages of different silver additions, Bi-Ag_x (x = 3.0, 3.5, 4.0, 4.5 and 5.0 Wt.%) have been developed by rapidly solidification processing (RSP) using melt-spun technique as a promising candidate for the replacement of conventional Sn-37Pb common solder. The effect of the addition of a small amount of Ag on the structure, microstructure, thermal and properties of Bi-Ag solder was analyzed by means of X-ray diffractometer, scanning electron microscopy, differential scanning calorimetry and Vickers hardness technique. Applying the RSP commonly results in departures from conventional microstructures, giving an improvement of grain refinement. Furthermore, the grain size of rhombohedral hexagonal phase Bi solid solution and cubic IMC Bi_0.97Ag_0.03 phase is refined by Ag addition. Microstructure analysis of the as soldered revealed that relatively uniform distribution, equiaxed refined grains of secondary IMC Bi_0.97Ag_0.03 particles about 10 µm for Bi-Ag_4.5 dispersed in a Bi matrix. The addition of trace Ag led to a decrease in the solidus and liquidus temperatures of solder, meanwhile, the mushy zone is about 11.4°C and the melting of Sn-Ag_4.5 solder was found to be 261.42°C which is lower compared with the Sn-Ag₃ solder 263.60°C. This means that the silver additions into Bi enhance the melting point. The results indicate that an obvious change in electrical resistivity (?) at room temperature was noticed by the Ag addition. It was also observed that the Vickers microhardness (H_v) was increased with Ag increasing from 118 to 152 MPa. This study recommended the use of the Bi-Ag lead-free solder alloys for higher temperature applications.

Silver content is very important for the soldering process and solder joint reliability. Based on the present investigations described in this study, several conclusions were found regarding an evaluation of microstructural and mechanical deformation behavior of various Bi-Ag solders. The effect of Ag and rapid solidification on the melting characteristics, and microstructure of Bi-Ag alloys were studied. In addition, the mechanical properties of Bi with different low silver were investigated. From the present experimental study, the following conclusions can be drawn. The addition of Ag had a marked effect on the melting temperature of the lead-free solder alloys, it decreases the melting temperature of the alloy from 263.6 to 261.42°C. Bi-Ag solders are comprised of rhombohedral Hex. Bi solid solution and cubic Ag_0.97Bi_0.03 IMC is formed in the Bi matrix. The alloying of Ag could refine the primary Bi phase and the Bi_0.97Ag_0.03 IMC. With increasing Ag content, the microstructure of the Bi-Ag gradually changes from large dimples into tiny dimple-like structures. The refinement of IMC grains was restrained after silver particles were added into the matrix. The inhibition effect on the growth of IMC grains was most conspicuous when solder was doped with Ag particles. As a result, the Vickers microhardness of the Bi-Ag lead-free solder alloys was enhanced by more than 100% ranging from 118.34 to 252.95 MPa. Bi-Ag high-temperature lead-free solders are a potential candidate for replacing the tin-lead solder (Sn-37Pb) materials which are toxic to human and the environment and has already been banned.

This study recommended the use of the Bi-Ag lead-free solder alloys for high-temperature applications.

In recent years, efforts to develop alternatives to lead‐based solders have increased dramatically. These efforts began as a response to potential legislation and regulations restricting lead usage in the electronics industry. Lead is extremely toxic when inhaled or ingested. As researchers began to focus on Pb‐free solders, they recognized their value in high temperature applications (e.g. automotive manufacturing) where Sn/Pb solders do not meet the requirements. There are many factors to consider when developing lead‐free alloys: manufacturability, availability, reliability, cost and environmental safety. Of these, the most challenging and time consuming is the reliability of alternative solders. The lead‐free alloys available cannot be used as a drop‐in replacement for the SnPb or SnPbAg. The introduction of lead‐free solder alloys may mean having to use alternative component and PCB metallizations, PCB materials, solder fluxes, etc.

Vapor phase soldering (VPS), also known as condense soldering, is capable of improving the mechanical reliability of solder joints in electronic packaging structures. The paper aims to discuss this issue.

In the present study, VPS is utilized to assemble two typical packaging types (i.e. ceramic column grid array (CCGA) and BGA) for electronic devices with lead-containing and lead-free solders. By applying the peak soldering temperatures of 215°C and 235°C with and without vacuum condition, the void formation and intermetallic compound (IMC) thickness are compared for different packaging structures with lead-containing and lead-free solder alloys.

It is found that at the soldering temperature of 215°C, CCGA under a vacuum condition has fewer voids but BGA without vacuum environment has fewer voids despite of the existence of lead in solder alloy. In light of contradictory phenomenon about void formation at 215°C, a similar CCGA device is soldered via VPS at the temperature of 235°C. Compared with the size of voids formed at 215°C, no obvious void is found for CCGA with vacuum at the soldering temperature of 235°C. No matter what soldering temperature and vacuum condition are applied, the IMC thickness of CCGA and BGA can satisfy the requirement of 1.0–3.0 µm. Therefore, it can be concluded that the soldering temperature of 235°C in vacuum is the optimal VPS condition for void elimination. In addition, shear tests at the rate of 10 mm/min are performed to examine the load resistance and potential failure mode. In terms of failure mode observed in shear tests, interfacial shear failure occurs between PCB and bulk solder and also within bulk solder for CCGA soldered at temperatures of 215°C and 235°C. This means that an acceptable thicker IMC thickness between CCGA solder and device provides greater interfacial strength between CCGA and device.

Due to its high I/O capacity and satisfactory reliability in electrical and thermal performance, CCGA electronic devices have been widely adopted in the military and aerospace fields. In the present study, the authors utilized VPS to assemble a typical type of CCGA with the control package of conventional BGA to investigate the relation between essential condition (i.e. soldering temperature and vacuum) to void formation.

PCB manufacturers are switching from the use of RMA fluxes in their soldering and rework processes to low residue type (i.e., ‘no‐clean’) fluxes. Unfortunately, successful changeover is not simply a matter of substituting a no‐clean into an existing RMA process. Soldering process parameters must change, necessitating an understanding of the interplay between flux chemistry and heat delivery. Higher temperatures can result in an effective decrease in the concentration of the active fluxing agents. Also, data show a decrease in the inherent wetting force of a no‐clean flux with increasing temperature. These two factors reduce fluxing action below the rate of oxidation occurring at the solder connection and the soldering iron tip. These can lead to incomplete surface cleaning and inefficient heat transfer, resulting in poorly soldered connections. Lower solder joint defect rates are obtained with no‐clean solders and fluxes when soldering temperatures are reduced to a minimum.

This paper will review the challenges brought by lead‐free soldering and some preliminary experimental evaluation results will be discussed. The initial results show that the lead‐free soldering process with 260°C reflow peak temperature does not directly cause failures for bismaleimide‐triazine (BT)‐based fine pitch ball grid array (FPBGA) packages. However, the strict lead‐free soldering condition could degrade the integrity of weak interface joints and potentially damage the package in subsequent unbiased highly accelerated stress test (unbiased HAST) evaluation. The impacts of lead‐free soldering with high reflow temperature on concurrent available electronics components could be more severe than previously believed. In the future, new materials and design concepts should be applied to enhance the package reliability under strict lead‐free soldering conditions.

The purpose of this paper is to investigate the effect of different soldering temperatures on the performance of chip-on-board (COB) light sources during vacuum reflow soldering.

First, the influence of the void ratio of the COB light source on the steady-state voltage, luminous flux, luminous efficiency and junction temperature has been explored at soldering temperatures of 250°C, 260°C, 270°C, 280°C and 290°C. The COB chip has also been tested for practical application and aging.

The results show that when the soldering temperature is 270°C, the void ratio of the soldering layer is only 5.1%, the junction temperature of the chip is only 76.52°C, and the luminous flux and luminous efficiency are the highest, and it has been observed that the luminous efficiency and average junction temperature of the chip are 107 lm/W and 72.3°C, respectively, which meets the requirements of street lights. After aging for 1,080 h, the light attenuation is 84.64% of the initial value, which indicates that it has higher reliability and longer life.

It can provide reference data for readers and people in this field and can be directly applied to practical engineering.

A study was performed which investigated the wettability of 63Sn‐37Pb and 96.5Sn‐3.5Ag solders on copper and gold ‐nickel plated Kovar ™ using a rosin ‐based, mildly activated (RMA) flux, a water soluble organic acid flux (WS ),and a low residue (LR) flux. The quantitative metric was the contact angle, θ_c, measured by the meniscometer /wetting balance technique. The first part of the study (Part 1) examined wetting performance following continuous exposure to 25°C prior to testing. Then, a preheating step was introduced into the experimental procedure after flux application, but preceding the actual wettability test in order to simulate a factory reflow process; these results are presented in Part II of this study. Contact angles for the 63Sn‐37Pb solder (215°C) on copper were 22±2° with the RMA flux, 12±5° for the WS flux, and 31±6° for the LR flux. Increasing the 63Sn‐37Pb solder temperature to 245°C improved wettability with the RMA and LR fluxes, but no change was observed with the WS fulx. Theii 96.5Sn‐3.5Ag lead ‐free solder exhibited poorer wettability on copper compared with the 63Sn‐37Pb alloy, with contact angles of 41±2° (RMA), 63±15°(WS) and 39±4°(LR). For the gold ‐nickel plated Kovar™ substrates, the 63Sn‐37Pb solder at 215° had contact angles of 15±3°, 35±6° and 29±6° for the RMA, WS and LR fluxes, respectively. The values were reduced at the higher test temperature (245°). The 96.5Sn‐3.5Ag solder also exhibited good wetting performance on the gold ‐nickel plated Kovar™ specimens compared with copper. Analysis of the interfacial tension parameters, γ_SF‐γ_SLand γ_LF ,exemplified the importance of γ_LF as well as the condition of the surfaces (γ_SF ) on wettability performance. A so ‐called ‘combined analysis’ of the 63Sn‐37Pb and 96.5Sn‐3.5Ag wettability data on either copper or gold ‐ nickel plated Kovar™ substrates was used to predict the solder temperature dependence of wettability for the three fluxes and two base materials.

To give an overview of the issues encountered, and changes that need to be made in the various types of soldering process when converting them from conventional to lead‐free assembly.

This paper has been written to provide a review of the lead‐free reflow, wave and hand soldering processes. Problem areas highlighted and methods for adjusting and optimising each type of soldering process for compatibility with lead‐free solders are described.

The move to lead‐free soldering in electronics assembly can lead to a number of issues that affect process performance, yields and reliability. Problems that are sometimes encountered with conventional lead‐bearing solders can exacerbated when moving to lead‐free. Many of the issues are associated with the higher melting points of the recommended lead‐free solders. Fortunately, these issues are now well known and, with care and attention to process optimisation, they can largely be avoided.

The value of the paper lies in its ability to provide information on the types of problems and issues encountered when moving to lead‐free solders and the advice it gives on how to avoid them. It also describes how to convert the various lead‐free soldering processes used in PCB assembly using a range of measures that can minimise defects, avoid common problems and optimise yields. Sources of additional assistance are also identified.