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Article
Publication date: 1 August 1996

V. Kripesh, S.K. Bhatnagar, H. Osterwinter and W. Gust

Temperature humidity acceleration factors for surface conductance areobtained to relate the reliability of film conductors formed by different processes. Analytical expressionsfor…

197

Abstract

Temperature humidity acceleration factors for surface conductance are obtained to relate the reliability of film conductors formed by different processes. Analytical expressions for acceleration factor are evolved for both screen‐printed and laser micromachined conductor samples. The rapid solidification of metal conductors due to laser micromachining and its effect on surface conductance are also studied. An analytical expression for the most common accelerated test condition (85°C, 85% relative humidity) is also derived for both screen‐printed and laser micromachined samples.

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Microelectronics International, vol. 13 no. 2
Type: Research Article
ISSN: 1356-5362

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Article
Publication date: 1 January 1991

H. Binner, M.S. Setty, P. Collander and C.H. Garnett

A recent meeting involved co‐operation with the organisers of the Canadian High Technology Show and the local Chapter of the SMTA. The programme included an inspiring keynote…

Abstract

A recent meeting involved co‐operation with the organisers of the Canadian High Technology Show and the local Chapter of the SMTA. The programme included an inspiring keynote address by Mr Frank J. Pipp, Xerox Corporation. The topic of the address was ‘Malcolm Baldridge National Quality Control and the Evaluation of Total Quality Control in Xerox Corporation.’

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Microelectronics International, vol. 8 no. 1
Type: Research Article
ISSN: 1356-5362

Article
Publication date: 1 December 1996

V. Kripesh, S.K. Bhatnagar, H. Osterwinter and W. Gust

A laser ablation technique has been used to fabricate conductor patterns on a 96%alumina substrate to evolve passive fine‐line components and structures. This paper reports the…

145

Abstract

A laser ablation technique has been used to fabricate conductor patterns on a 96% alumina substrate to evolve passive fine‐line components and structures. This paper reports the method of fabricating better fine‐line passive components for hybrid microelectronics application. The effect of a laser beam on the conductor and 96% alumina (Al2O3) substrate was studied in detail. Three predominant structures — namely debris, ablation border and irradiated bottom layer — were seen on the patterns. A detailed study of the dendritic growth caused by electrochemical migration on conductor lines fabricated by conventional screen printing and by laser ablation techniques is also reported.

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Microelectronics International, vol. 13 no. 3
Type: Research Article
ISSN: 1356-5362

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Article
Publication date: 1 March 1989

B. Turnbull

Jenny Wheeler has recently joined PRTM Ltd, an international operations management consultancy company offering implementation orientated support to high technology industry. PRTM…

Abstract

Jenny Wheeler has recently joined PRTM Ltd, an international operations management consultancy company offering implementation orientated support to high technology industry. PRTM Ltd has considerable experience in streamlining the manufacturing, distribution and services process. Jenny has joined to strengthen their rapidly expanding service in the area of Product Development/Time‐to‐Market, where they have currently helped clients achieve reductions in product development cycle times by more than 50%.

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Microelectronics International, vol. 6 no. 3
Type: Research Article
ISSN: 1356-5362

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164

Abstract

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Microelectronics International, vol. 16 no. 2
Type: Research Article
ISSN: 1356-5362

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