Search results

For soldering, flux is essential because it enables the wetting of the molten solder. Fluxless soldering, i.e. residue-free soldering with the aid of gaseous activators, has been known for many years, but is only well established in the field of opto- and microwave electronics where the solder is applied as preform. In high-volume SMD applications where solder paste is printed, this technology is rarely used until now. The reducing effect of a gaseous activator like formic acid vapor on certain solder alloys is known in practice. However, the corresponding reactions which occur under soldering conditions in nitrogen atmosphere have so far not been systematically investigated for different solder alloys. This study aims to analyze the different chemical reaction channels which occur on the surface of different solders, i.e. catalytical dissociation of formic acid on the pure or oxidized metal surface and the formation and evaporation of metal formates. Based on this analysis, a residue-free solder process under formic acid is developed for solder paste applications.

In this paper, different solder alloys (SnAgCu, SnPb, BiSn, In) were analyzed with thermal gravimetric analysis (TGA) under formic acid flow. Details on mass change depending on the soldering temperature are presented. Activation temperatures are estimated and correlated to the soldering processes. Based on the analysis, fluxless solder pastes and suitable soldering processes are developed and presented. Major paste properties such as printability are compared to a commercial flux solder paste. High-power flip chip LEDs which can be assembled directly on a printed circuit board are used to demonstrate the fluxless soldering. Likewise, the soldering results of standard paste and fluxless paste systems after a reflow process are evaluated and compared.

The experimental results show that TGA is an efficient way to gain deeper understanding of the redox processes which occur under formic acid activation, i.e. the formation of metal formates and their evaporation and dissociation. It is possible to solder residue-free not only with preforms but also with a fluxless solder paste. The resulting solder joints have the same quality as those for standard solder paste in terms of voids detected by X-ray and mechanical shear strength.

In the fluxless soldering process, the reduction of oxide layers, and therefore the wetting of the solder spheres, is enabled by gaseous formic acid. After the soldering process, no cleaning process is necessary because no corrosive residues are left on the circuit boards and components. Therefore, soldering using solder paste without aggressive chemical ingredients has a high market potential. Expensive preforms could be replaced by paste dispensing or paste printing.

The solder interconnection of components to printed circuit boards normally utilises a flux to enable the efficient removal of oxide layers from the metals to be joined. While this produces a strong metallurgical bond, the flux residue left behind after the soldering process can be detrimental to the long‐term performance of the product. Therefore, after assembly, a cleaning process is often employed to remove the residue, however, this incurs extra financial and environmental costs. In this work, organic coatings have been used to preserve copper surfaces in an oxide free state, enabling fluxless soldering to take place. These coatings, if stored appropriately, were found to be effective in preventing the oxidation of copper for several weeks, however, they are readily displaced by the soldering process allowing the active copper surface to be wetted. Wetting balance testing and surface analysis have been used to assess the preservation of copper coupons following storage in air.

To investigate fluxless plasma ball bumping and effect of under bump metallization (UBM) thickness on joint properties using lead‐free solders.

A fluxless soldering process was investigated in this study using Ar‐10 percent H₂ plasma reflow. Balls made from two lead‐free solders (Sn‐3.5 weight percent Ag and Sn‐3.5 weight percent Ag‐0.7 weight percent Cu) were reflowed and, also Sn‐37 weight percent Pb as a reference. In particular, the effects of the UBM thickness on the interfacial metallurgical bonding and joint strength were studied. The UBM (Au/Cu/Ni/Al layers) thicknesses were 20 nm/0.3 μm/0.4 μm/0.4 μm and 20 nm/4 μm/4 μm/0.4 μm, respectively.

The experimental results showed that in the case of a thin UBM the shear strengths of the soldered joints were relatively low (about 19‐27 MPa) due to cracks observed along the bond interfaces. The thick UBM improved joint strength to 32‐42 MPa as the consumption of the Cu and Ni layers by reaction with the solder was reduced and hence the interfacial cracks were avoided. To provide a benchmark, reflow of the solders in air using flux was also carried out.

This paper provides information about the effect of UBM thickness on joint strength for plasma fluxless soldering to researchers and engineers.

During the last few years an increasing number of flip‐chip (FC) interconnection technologies have emerged. While flip‐chip assembly offers many advantages compared with conventional packaging techniques, several aspects prevent this technology from entering the high volume market. Among these are the availability of bumped chips and the costs of the substrates, i.e., ceramic substrates with closely matching coefficient of thermal expansion (CTE) to the chip, in order to maintain high reliability. Only recently, with the possibility of filling the gap between chip and organic substrate with an encapsulant, was the reliability of flip‐chips mounted on organic substrates significantly enhanced. This paper presents two approaches to a fluxless process, one based on soldering techniques using Au‐Sn metallurgy and the other on adhesive joining techniques. Soldering is performed with a thermode and with a laser based system. For both of these FC‐joining processes, alternative bump mettallurgies based on electroplated gold, electroplated gold‐tin, mechanical gold and electroless nickel gold bumps are applied.

Due to increasing density and high demands on electrical and thermal performance, modern packages require alternative chip interconnection and substrate technologies. Flip‐chip (FC) bonding is a suitable method for high interconnection densities. Compared with wire bonding and TAB, FC provides the highest contact density. This is due to the possibility of using the whole chip surface for bondpads (area bumps). In this paper, an adapted FC technology on green tape ceramic substrates was investigated. In order to reduce the substrate costs, FC bonding was performed directly on the thick film metallisation without the application of thin film technology for the upper substrate layers. Two solder bump metallurgies: PbSn95/5 and Au/Sn solder bumps were applied for fluxless FC bonding on adapted substrate metallisations. Fluxless soldering is performed by single chip bonding and requires substrates with narrow planarity tolerances. An alternative method using a wet eutectic Au/Sn solder paste on the substrate and Au bumps permits the application of substrates with standard planarity tolerances used in thick film applications. A common reflow of all chips of a multichip module is possible. First reliability results of metallurgical analysis and of the mechanical and electrical behaviour of the FC contacts after thermal cycling are presented.

The purpose of this research was to develop a new process to bond silicon (Si) chips to low carbon steel substrates using pure tin (Sn) without any flux.

Iron (Fe) substrates were first electroplated with a Sn layer, followed by a thin silver (Ag) layer that inhibits Sn oxidation thereafter. It is this Ag capping layer that makes the fluxless feature possible. Fluxless processes are more environmentally friendly and more likely to produce joints without voids. The Si chips were deposited with Cr/Au dual layer structure. The bonding process was performed at 240°C in vacuum. The Sn joint thickness was controlled by spacers during the bonding. Scanning electron microscopy images on cross sections exhibited quality joints without visible voids. Energy dispersive X-ray spectroscopy analysis was used to detect joint compositions.

It was revealed that the Sn layer was bonded to a Si chip at the Cr–Sn interface and to the Fe substrate by forming an FeSn₂ intermetallic compound (IMC). The IMC is only 1.1 to 1.5 µm in thickness. Thin IMC is highly preferred because IMC deforms a little in accommodating the coefficient of thermal expansion (CTE) mismatch between Si and Fe. Shear test results showed that the fracture forces of the samples passed the military criteria by a wide margin.

This new fluxless bonding process on Fe should make Fe or low carbon steel a more likely choice of materials in optical modules and electronic packages.

Fluxless wave soldering in a nitrogen atmosphere was investigated for epoxy‐fibreglass circuit board coupons having bare copper and solder‐coated through‐holes. The Reduced Oxide Soldering Activation (ROSA™) pretreatment was found to consistently provide good hole filling and through‐hole solder joints of excellent appearance. For preheated coupons, low levels of residual oxygen and short exposure to air after the ROSA treatment were found to have no effect

In the surface mount industry, microelectronic devices are reflow soldered to printed circuit boards with the benefit of mildly activated rosin (RMA) based fluxes. The residues from these fluxes, when not properly cleaned from the component boards, have been cited for decreased circuit life due to corrosion of the solder joints and loss of insulating resistance. Post‐solder cleaning operations with CFC (chlorofluorocarbon) solvents have been deemed environmentally harmful. Hence, there is a great need in the surface mount community for a no‐clean or fluxless solder reflow process. The BOC Group has developed a novel, proprietary process, by which circuit boards and their components are attached with a solder paste under a reactive fluxing atmosphere. The post‐solder residue is non‐corrosive and so minimal that it does not require a post‐solder cleaning operation. The solder joints exhibit good wetting, excellent joint strength and are essentially void‐free. Assembled circuits processed in this way meet all the criteria for ionic cleanliness and surface insulation resistance without post‐solder cleaning.

Laser soldering has attracted attention as an alternative soldering process for microsoldering due to its localized and noncontact heating, a rapid rise and fall in temperature, fluxless and easy automation compared to reflow soldering.

In this study, the metallurgical and mechanical properties of the Sn3.0Ag0.5Cu/Ni-P joints after laser and reflow soldering and isothermal aging were compared and analyzed.

In the as-soldered Sn3.0Ag0.5Cu/Ni-P joints, a small granular and loose (Cu,Ni)6Sn5 intermetallic compound (IMC) structure was formed by laser soldering regardless of the laser energy, and a long and needlelike (Cu,Ni)6Sn5 IMC structure was generated by reflow soldering. During aging at 150°C, the growth rate of the IMC layer was faster by laser soldering than by reflow soldering. The shear strength of as-soldered joints for reflow soldering was similar to that of laser soldering with 7.5 mJ, which sharply decreased from 0 to 100 h for both cases and then was maintained at a similar level with increasing aging time.

Laser soldering with certain energy is effective for reducing the thickness of IMCs, and ensuring the mechanical property of the joints was similar to reflow soldering.

The purpose of this paper is to evaluate the effect of nitrogen and air atmospheres on the solderability testing of plasma‐treated hot air solder level (HASL) finish printed circuit boards (PCBs).

In this paper, the soldering performance of plasma‐treated HASL finish PCBs in nitrogen and air atmospheres have been evaluated using the wetting balance technique. The results were compared with the performance of conventionally flux‐treated samples soldered in air and nitrogen atmospheres and non‐flux treated samples soldered in air. Auger chemical analysis results were also compared with the solderability test results in order to obtain a complete profile of the plasma‐treated and non‐treated surfaces.

The results of the auger chemical analysis show high organic (carbon) levels in the control samples and a significant drop in organic levels in the plasma‐treated samples. The significant drop in the level of carbon leads to a decrease in contact angle and an increase in both surface energy and solder wettability. The results indicate that plasma cleaning of PCBs prior to soldering is a viable alternative to the conventional use of flux.

The paper indicates that the soldering performance of plasma‐treated PCBs in air and nitrogen atmosphere are comparable. The findings give the motivation for the use of plasma‐assisted dry cleaning for fluxless soldering.