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The purpose of this paper is to investigate the effect of substrate material and thickness on the thermal cycling reliability of flip chip joints assembled with anisotropic conductive adhesives (ACA).

Four test lots are assembled using three different substrates. Two of the substrates are made of FR‐4. The thicknesses of these substrates are 600 and 100 μm. The third substrate is made of liquid crystal polymers (LCP) and is flexible. With the thicker FR‐4 substrate two test lots are assembled using both normal and two‐step bonding profiles to study how the bonding profile affects the deformation of the substrate. Four different bonding pressures are used to study the effect of pressure on reliability and the failure mechanism of the ACA joints. The reliability of the test samples is studied using a temperature cycling test.

The reliability of the test lot with the LCP substrate is considerably better than that of the test lots with the FR‐4 substrates. Additionally, the thinner FR‐4 substrate has better reliability than the thicker FR‐4 substrate. The failure mechanisms found varied among the test lots. The effect of the two‐step bonding process on the deformation of the substrate is found to be minor compared with the effect of the glass fibres.

The work shows that the thermal cycling reliability of ACA flip chip joints is markedly influenced by the thickness and material of the substrate. It is also seen that the substrate used influences the failure mechanisms formed during thermal cycling testing.

In recent years, with the development trends towards lighter, shorter and smaller high performance and high reliability electronic products, printed circuit boards have ceaselessly been growing in terms of higher density and layer count. At present, conventional FR‐4 laminate, which is reinforced by glass fabric, has become the universal purpose base material because of its excellent adhesion, good electrical insulation and mechanical properties. However, with its relatively low glass transition temperature (T_g) of approximately 135°C, large coefficient of thermal expansion in the z‐axis direction, poor thermal resistance and propensity for resin smear while drilling, normal FR‐4 is severely limited in high performance applications, especially for multilayer board fabrication, and is used only for multilayer boards with layer counts below ten. Furthermore, conventional FR‐4 is usually cured using dicyandiamide, which could potentially cause insulation deterioration of the printed circuit boards and vulnerability in terms of delamination under high temperature treatment. These effects could degrade the reliability of PCBs and therefore, base material suppliers have focused on improving the T_g and thermal resistance to broaden the operating window of conventional FR‐4.

The purpose of this paper is to study the effect of conformal coating on the thermal cycling reliability of anisotropically conductive adhesive film (ACF) joined flip chip components on FR‐4 and polyimide (PI) substrates.

Test chips were joined using flip chip technology and an anisotropically conductive adhesive. The conformal coating used was parylene C and it was applied using the vapour deposition polymerisation method. The reliability of ACF joined flip chip components on FR‐4 and PI substrates was evaluated using −40/+85°C thermal cycling testing. Test lots with and without parylene C coating were studied. Additionally, one test lot with initial moisture inside the coating layer and a PI substrate was subjected to the test. The reliability results were analyzed using Weibull analysis and failure analysis was performed to study the failure mechanisms using cross sectioning and optical and scanning electron microscopy.

The results show a clear difference between the FR‐4 and PI substrate materials. PI substrate material proved to be reliable enough to withstand the thermal cycling testing. Two different occurrences of the first failures are seen and analyzed with FR‐4 substrates. The conformal coating layer did not seem to impair the reliability. Parylene C coating proved to be a reliable choice to protect, and even improve, the thermal cycling reliability of flip chip devices.

Usually, conformal coatings are studied in humidity tests. However, it is also vital to know whether the conformal coatings affect the reliability in thermal cycling and there is a lack of reliability studies in this area. This paper gives reliability data for conformal coating users about the influence of thermal cycling.

Thermal cycling tests and failure modelling were conducted on FR‐4 and cyanate ester printed circuit board (PCB) substrate materials to evaluate reliability limits tor solder and repair processes, particularly for high pin count, through‐ hole devices. The boards used were double‐sided, 0.125 in. thick with 0.029 in. diameter plated‐through holes (PTHs). Thermal cycling was accomplished using hot oil immersion at 240°C and 260°C followed by forced room‐temperature air. The average number of thermal cycles‐to‐failure was 10 for FR‐4, 20 for cyanate ester epoxy blend, and 50 for cyanate ester. Weibull statistics were used to predict failure rates for various pin count devices. Failure analysis was used to identify the mechanism of failure, and modelling was used to predict cycles‐to‐failure based on typical material properties. The primary failure mechanism was corner cracking in FR‐4 and a combination of corner cracking and barrel cracking in the cyanate ester materials. The modelling used a modified pad tilt geometry combined with Coffin‐Manson low cycle fatigue theory, which resulted in predictions of the same order as those for the cycling tests. Key material properties and process parameters were identified that controlled the failure response of the plated‐through hole and board substrate combinations.

Currently, the most widely used Printed Circuit Board (PCB) base material is the glass reinforced epoxy known as FR‐4. To improve the electrical or the thermomechanical performance of PCBs, there are two possibilities from a material standpoint: a modification or change of the resin system and a change of the reinforcement. Currently, there are a number of resins used for high performance PCB base materials. These resin systems offer higher Tgs and lower z‐axis‐expansions for improved through hole reliability. Non‐halogenated epoxy resin systems are offered for the production of green PCBs. In addition to new resins, new reinforcements are available for use in PCBs. Which can improve the electrical parameters of the base material and the x and y axis‐ thermal expansion also changes with the use of those reinforcements. This paper compares the thermomechanical and electrical parameters of some new high performance and green base materials with the glass reinforced epoxy materials commonly used in both high layer count boards and microvia applications.

Reports the research and development results on flip chip on FR‐4 and ceramics, using anisotropic conductive film (ACF), anisotropic conductive paste (ACP), or eutectic solder with underfill. Several types of ACF and ACP with different types of conductive particles and adhesives were investigated. Simple but high yield procedures for reworking flip chip on board using ACP and ACF were developed. Processes for flip chip on FR‐4 and ceramic boards using eutectic solder bumps with underfill were also evaluated. The flip chips were assembled on test vehicles for temperature cycling and high‐temperature high‐humidity tests. The reliability performance of the three processes (gold bumps with ACF, gold bumps with ACP, and eutectic solder bumps with underfill) is compared.

The purpose of this paper is to evaluate the reliability of solder joints made on long FR-4 and metal core printed circuit boards using the accelerated thermal cycling.

Solder joints of diodes and resistors samples made on long FR-4 and aluminum (Al) core printed circuit boards were examined. Two kinds of solder pastes were used for the samples preparation. All samples were subjected to temperature aging cycles (−40°C – 3 hours/+85°C – 3 hours). Solder joints resistance, X-Ray inspection and metallographic cross-sections for samples as received and after 100, 500 and 1,000 hours of thermal cycles were utilized for solder joints assessment.

It was stated that 1,000 hours of thermal cycles were enough to show reliability problems in solder joints on long and/or AL core printed circuit board assembly (PCBA). The solder joints of R1206 components were the most sensitive reliability elements. The solder joints of LED diodes are more reliable than solder joints of R1206 resistors. Solder joints made on FR-4 substrate were about two times more reliable than ones on AL core substrate. Cracks in solder joints were the visible reason of solder joints failures.

The influence of thermal cycles on the reliability of solder joints on long, FR-4 and metal core printed circuit boards were presented. Findings from this paper can be used for planning of reliability trials during validation of reflow processes of products containing long or long metal core printed circuit boards (PCBs).

Large capacity current carrier printed circuit board (PCB) imposes strict control requirements on the hole wall roughness. The key factors are chip removal, drilling temperature and tool wear. This paper aims to find out a cryogenic drilling process to control the chip removal, chip morphology, tool wear and finally reduce the hole wall roughness.

The chip removal process, chip morphology, tool wear and hole wall roughness of glass fiber epoxy resin copper clad laminate (FR-4) drilling were observed and analyzed. The influence of cold air on the chip removal process, chip morphology, tool wear and hole wall roughness was also investigated. An optimization process of cold air auxiliary drilling was proposed to control the hole wall roughness of FR-4.

The results showed that the discharge time of copper foil chips with obvious characteristics can be used as the evaluation criterion for the smoothness of chip removal. The cold air can promote chip removal and reduce tool wear. In addition, the chip removal and cooling performance will be the best when using −4.7 °C cold air with the injection angle consisted with the angle of helical flute of the drill. The hole wall roughness of FR-4 could be controlled by drilling with −4.7°C cold air.

This paper was the first study of the effect of three kinds of cold air on PCB drilling. This provided a reference for the possibility that the cryogenic drilling methods apply to PCB drilling. A new cold air auxiliary drilling process was developed for large capacity current carrier FR-4 manufacturing.

Present‐day electronics are shifting increasingly towards surface mounting technology (SMT) and hybrid technology (thick and thin film), which offer greater advantages due to their fabrication processes. Capacitors, like other components used in these processes, must occupy the smallest volume possible. Because of miniaturisation of the capacitors, the reliability of the surface mounting process is affected not only by the reliability of the components themselves but also by that of the assembly. In this study, a thermo‐mechanical simulation has been performed by means of ANSYS software based on the finite element method. This paper deals with the evaluation of a ceramic capacitor module (capacitors soldered on copper lands) on FR‐4 or alumina substrates during cooling to room temperature (25°C). The parameters of the assembly — temperature, length and thickness of the capacitor, thickness of the solder joint and nature of the substrate — were chosen by using the Design Of Experiments (DOE) method, which permits optimisation of these parameters and reduces the investigation time. The results showed a correlation between the length of the capacitor and the nature of the substrate used. Greater capacitor length is required for alumina substrate while a shorter length is preferred for FR‐4. It appears that a solder joint more than 100 urn thick may induce significant constraints on the copper lands and on the capacitor leads. It was noted that shear stress and voids in the solder joint can occur at temperatures higher than 250°C. This investigation makes it possible to prevent thermo‐mechanical stress damage during the mounting process and gives some recommendations for the choice of assembly variables.

This paper discusses processes of flip chip on FR‐4 using eutectic solder bumps with possible fewer process steps compared to the full assembly process. Some interesting results in terms of the reliability performance of flip chip on FR‐4 assemblies using eutectic solder have been obtained after an almost‐one‐year temperature cycling test. The process steps of underfilling and curing of underfill can be omitted when a suitable epoxy is used for encapsulation. When underfill is conducted, encapsulation is not necessarily needed from a reliability point of view.