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Eutectic Sn‐Ag solder is being considered as a potential replacement for Sn‐Pb solders. A potential drawback to using the eutectic Sn‐Ag solder is its higher melting point, 221°C, compared with the eutectic Pb‐Sn solder. Owing to its higher melting temperature, the eutectic Sn‐Ag solder is also being considered for automotive under‐the‐hood applications, which experience high temperature environments. Electronic components and/or circuit boards are often coated with Pb‐bearing solder to facilitate soldering operations. Soldering Pb‐bearing solder coated components and/or boards with eutectic Sn‐Ag solder will result in joints contaminated with Pb. In this study, the effects of Pb contamination on eutectic Sn‐Ag solder joints were investigated using three ternary alloys made by incorporating some Pb into eutectic Sn‐Ag solder. These ternary alloys all showed a peak at 178°C in heating curves obtained using Differential Scanning Calorimetry (DSC), which resulted from the ternary eutectic composition in the Sn‐Ag‐Pb system. The Pb phases in the ternary alloys were found to be dispersed throughout the microstructure. A practical implication of Pb contamination in eutectic Sn‐Ag solder joints is that the service temperature of such joints would be limited by the lower melting temperature of the ternary eutectic phase.

This paper reviews the status of lead‐free solder development works. Some of the solder systems — Bi‐Sn, Bi‐Sn‐Fe, ln‐Sn, Sn, Sn‐Ag, Sn‐Ag‐Zn, Sn‐Ag‐Zn‐Cu, Sn‐Bi‐Ag, Sn‐Cu, Sn‐Cu‐Ag, Sn‐In‐Ag, Sn‐Sb, Sn‐Zn and Sn‐Zn‐ln — are discussed in more detail, while others are briefly commented on. In general, compared with eutectic Sn‐Pb solder, all the lead‐free solder alternatives investigated more or less exhibit some shortcomings, such as price, physical, metallurgical or mechanical properties. Relatively, Sn‐ln‐containing systems are more promising in terms of solder mechanical properties and soldering performance, although the price of ln may be a concern. Eutectic Sn‐Ag solder doped with Zn, Cu or Sb exhibits good mechanical strength and creep resistance, due to refined microstructure. The Bi‐Sn systems doped with other elements may have a niche in the low temperature soldering field. Eutectic Sn‐Cu has good potential due to its good fatigue resistance. The eutectic Sn‐Zn system modified with ln and/or Ag may be promising in terms of mechanical properties. Finding a lead‐free alternative for high temperature solders presents the biggest challenge to the industry.

A study was performed to develop a different experimental methodology to assess wettabilities of solders on various printed wiring board (PWB) finishes, based on a modified spreading test in which solder pastes were heated following temperature reflow profiles representative of those used in surface mount technology (SMT) instead of using a fixed rate temperature ramp. Three solder alloys (Sn63‐Pb37, Sn96.5‐Ag3.5, and CASTIN^TM: Sn96.2‐Ag2.5‐Cu0.8‐Sb0.5), two fluxes (rosin, mildly activated, RMA, and no‐clean, NC), and seven PWB finishes (Pd, Au/Ni, Ni, Ag, Sn, and organic solderability preservatives: OSP), and bare copper were involved in the study. Better wettabilities were observed in the current study than the results reported in the literature for conventional tests on the same combination of solder alloy, flux, and substrate. The different results in measurement of wettabilities obtained in the current study were attributed to the more adequate heating process allowing flux activation, which reduced reoxidation of solder powders and substrates during the reflow process and thus improved wettabilities of solders. Compared to the results obtained from the popular wetting balance test, the current study demonstrated a more realistic simulation of, and approach to, assessing the wettability of solder for SMT.

This paper discusses the microstructures of solder joints and the mechanism of thermal fatigue, which is an important source of failure in electronic devices. The solder joints studied were near‐eutectic Pb‐Sn solder contacts on copper. The microstructure of the joints is described. While the fatigue life of near‐eutectic solder joints is strongly dependent on the operating conditions and on the microstructure of the joint, the metallurgical mechanisms of failure are surprisingly constant. When the cyclic load is in shear at temperatures above room temperature the shear strain is inhomogeneous, and induces a rapid coarsening of the eutectic microstructure that concentrates the deformation in well‐defined bands parallel to the joint interface. Fatigue cracks propagate along the Sn‐Sn grain boundaries and join across the Pb‐rich regions to cause ultimate failure. The failure occurs through the bulk solder unless the joint is so thin that the intermetallic layer at the interface is a significant fraction of the joint thickness, in which case failure may be accelerated by cracking through the intermetallic layer. The coarsening and subsequent failure are influenced more strongly by the number of thermal cycles than by the time of exposure to high temperature, at least for hold times up to one hour. Thermal fatigue in tension does not cause well‐defined coarsened bands, but often leads to rapid failure through cracking of the brittle intermetallic layer. Implications are drawn for the design of accelerated fatigue tests and the development of new solders with exceptional fatigue resistance.

Tape automated bonding (TAB) is a suitable technology for assembling ICs with a high number of l/Os. The gang bonding process usually applied requires increasing thermode forces for chips with high lead counts and narrow tolerances regarding thermode parallelism and planarity. Due to the high bonding pressure, TC bonding of Au bumps to Au‐plated tapes becomes critical for these applications. In order to avoid damage to the pad structure an inner lead bonding (ILB) process with reduced pressure is required. A tape metallisation of 0.5–1.0 µm Sn is not sufficient for a significant reduction of thermode pressure. As an alternative, the application of an eutectic Au‐Sn cushion which is deposited on top of the bumps is presented. A modified bumping process was developed for the deposition of the solder bumps. Soldering of the Au‐Sn bumps to a Au‐plated tape was performed successfully by two techniques: thermode gang bonding and laser soldering. Bond parameters and tin layer thickness were optimised. Reliability investigations by thermal ageing were performed. The special metallurgical aspects of the system were investigated with a microprobe.

This paper describes effective thin‐film structure barrier metals for use as eutectic solder bumps. Shear strength and bump interconnection resistance were evaluated. The mutual diffusion in metals was investigated. Barrier metal structures —Cu/Ti,Ni/Ti and Cu/Cr—were evaluated after ageing. The Ni/Ti structure has good reliability according to ageing test results. Pd is used for improvement of solder wettability and as an oxidisation barrier. Consequently, it was concluded that a thin‐film Pd/Ni/ Ti barrier metal is suitable for use as eutectic solder bumps. The broken interfaces of the solder bumps were analysed by scanning auger electron spectrometry. In the thin‐film Cu/Ti structure, decrease in the shear strength is caused by three mechanisms, as determined from the broken interface analysis. The three mechanisms are mixed metal formation, Ti oxidisation and diffusion between barrier metals and Al. Furthermore, TCT and PCT were carried out on these eutectic solder bumps to confirm the interconnection reliability. The TCT and PCT results prove that electrical connection is stable.

The interfacial structure is vitally important for achieving a good joint reliability during service. The purpose of this paper is to systematically explore the effects of Zn addition into the Sn-3.5Ag eutectic solder on the formation of intermetallic compound (IMC) layer at the interface between Sn-3.5Ag-xZn (x = 0, 0.9 and 3) solders and Cu pad.

To obtain useful information on the formation of interfacial structure and to determine an effective way to avoid the formation of brittle joints, a series of Sn-Ag lead-free solders with different Zn contents were prepared and soldered. To investigate the IMC layers between Sn-3.5Ag-xZn (x = 0, 0.9 and 3) lead-free solders and the Cu pads, three specimens of the Sn-3.5Ag-xZn/Cu were soldered at 250°C for one min.

It is found that the addition of Zn in the Sn-3.5Ag eutectic solder can prompt the formation of Cu₅Zn₈ IMCs, and restrain the formation of the Cu₆Sn₅ IMCs. Moreover, the addition of Zn in the Sn-3.5Ag eutectic solder will reduce the solubility of Cu in the liquid solder, which accelerates the growth of the formed IMCs. Consequently, the thickness of IMC layer increases with increasing the content of Zn.

This paper usefully demonstrates how the addition of Zn favoured the formation of the Cu₅Zn₈ phase and restrained the formation of the Cu₆Sn₅ phase. Moreover, the addition of Zn in the Sn-Ag eutectic solder would reduce the solubility of Cu in the liquid solder, which accelerates the growth of the formed IMCs. Consequently, the thickness of the IMC layer increased with increasing concentration of Zn.

A simple analysis method was developed to determine the fatigue life of a ceramic ball grid array (CBGA) solder joint when exposed to thermal environments. The solder joint consists of a 90Pb/10Sn solder ball with eutectic SnPb solder on both top and bottom of the ball. A closed‐form solution, based on the calculation of the equilibrium of the displacements within the electronic package assembly, was first derived in order to calculate the solder joint strains during temperature cycling. In the calculation, an iteration technique was used to obtain a convergent solution for the solder strains, and the elastic material properties were used for all the electronic package assembly components except for the solder materials. A fatigue life prediction model was established.

An empirical study was conducted to determine the thermal fatigue behaviour of 1.27 mm pitch, J‐bend and gullwing surface mount solder joints, manufactured with four low‐temperature solders. Selected solder alloys were: 58Bi‐42Sn (wt %), 43Sn‐43Pb‐14Bi, 52ln‐48Sn and 40ln‐40Sn‐20Pb. Accelerated thermal cycling was used in conjunction with metallographic analysis and mechanical (pull) strength measurement to test their behaviour. The relative merit of each solder composition was determined by comparing it with 63Sn‐37Pb solder, subjected to identical testing conditions. The strength decreased linearly with increased number of thermal cycles for gullwing solder joints of all four solder alloys. The fatigue lifetime was relatively longer for 58Bi‐42Sn and 40ln‐40Sn‐20Pb than for other alloys, but significantly lower than that obtained with 63Sn‐37Pb solder. No discernible degradation of strength was observed with the J‐bend solder joints of any solder alloy, even after the completion of 6000 thermal cycles. Thermal fatigue resistance of the latter joints was attributed to a more favourable coefficient of thermal expansion (CTE) mismatch. Solder joint cracking occurred only in gullwing components soldered with 52ln‐48Sn, 40ln‐40Sn‐20Pb and 43Sn‐43Pb‐14Bi alloys, after 1000 or 2000 thermal cycles. The crack initiated on the outside surface of the solder fillet, and appeared to propagate through both phases of the microstructure. The stress‐induced heterogeneous coarsening of the microstructure was evident only with 43Sn‐43Pb‐14Bi solder, although not as prevalent as that usually observed with eutectic Sn‐Pb solder. Fatigue cracks were absent from solder joints of 58Bi‐42Sn and 63Sn‐37Pb alloys.

To provide further knowledge of the effect of solder composition and PCB surface finish on the creep properties of lead‐free SnAgCu solder joints.

Single‐overlap shear specimens were prepared for the creep testing. The test matrix included three different SnAgCu pastes with hypoeutectic, eutectic, and hypereutectic compositions. An Sn63Pb37 solder paste was used as a reference. The PCB finishes used were NiAu, organic solderability preservative (OSP) and immersion tin. The creep tests were performed at 85 and 105°C using a dead‐weight system.

According to the results, the SnAgCu solder with eutectic or near‐eutectic composition is the safest choice when the creep behaviour of solder joints is considered. Of the three different PCB surface finishes, immersion tin is the most favourable choice for use with SnAgCu joints when creep is the predominant deformation mechanism in the joints. On the NiAu finish the creep properties of SnAgCu solder joints were significantly weaker in eutectic and hypereutectic SnAgCu joints than on Sn and OSP.

The results can be used to enhance the reliability of SnAgCu joints in demanding conditions, when special attention is paid to the choice of PCB surface finish and SnAgCu solder composition.