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The electronics assembly industry has fortunately rediscovered conductive adhesives as the search for lead‐free joining materials and improved performance intensifies. Although these intrinsically clean bonding agents are often first sought for their favourable environmental attributes, many are surprised to find that conductive adhesives can solve old and new problems. Today, new polymer solders for SMT allow low temperature processing, finer pitch assembly and wider processing latitude while providing compatibility with a very much larger range of materials than solder. State‐of‐the‐art adhesives are oxide‐tolerant and absolutely no fluxing or cleaning is required. Adhesives work where solder cannot be used. What's more, polymer‐based solder alternatives can run on existing SMT lines — no new equipment is needed. Z‐axis, or anisotropic, bonding agents are uni‐directional conductive materials that solve fine pitch interconnect problems in several areas. The anisotropics now dominate the flat panel interconnect field. Nearly every LCD and other flat panel display is connected with a polymer adhesive. The Z‐axis adhesives are also beginning to enable high density multilayer circuits and MCMs to be built more effectively. Finally, Z‐axis appears to offer the simplest and most cost‐effective means for flip chip bonding. However, special equipment is required. The paper compares the metallurgical solder joint, the present de facto standard, with the polymer composite bond to highlight similarities and important differences. All types of conductive adhesives are discussed including the latest — Area Array Z‐axis types. Bonding materials, assembly processes and performance are also covered.

This review paper aims to provide a better understanding of formulation and processing of anisotropic conductive adhesive film (ACF) material and to summarize the significant research and development work for the mechanical properties of ACF material and joints, which helps to the development and application of ACF joints with better reliability in microelectronic packaging systems.

The ACF material was cured at high temperature of 190°C, and the cured ACF was tested by conducting the tensile experiments with uniaxial and cyclic loads. The ACF joint was obtained with process of pre-bonding and final bonding. The impact tests and shear tests of ACF joints were completed with different aging conditions such as high temperature, thermal cycling and hygrothermal aging.

The cured ACF exhibited unique time-, temperature- and loading rate-dependent behaviors and a strong memory of loading history. Prior stress cycling with higher mean stress or stress amplitude restrained the ratcheting strain in subsequent cycling with lower mean stress or stress amplitude. The impact strength and adhesive strength of ACF joints increased with increase of bonding temperature, but they decreased with increase of environment temperature. The adhesive strength and life of ACF joints decreased with hygrothermal aging, whereas increased firstly and then decreased with thermal cycling.

This study is to review the recent investigations on the mechanical properties of ACF material and joints in microelectronic packaging applications.

The purpose of the work is to investigate the feasibility of using anisotropically conductive adhesives to join surface‐mount devices as solder replacement. The results from a literature and market survey are reported. Based on industrial demands, two anisotropically conductive adhesives were chosen for the experimental work. During the experimental work, the conductive adhesive joints were produced at various curing conditions. The joints were characterised by shear testing and electrical resistance measurement after ageing at 20, 70 and 120°C to 1000 hours. Optical and scanning electron microscopy were used to characterise the adhesive joints. In addition to this, temperature cycling tests, humidity test and pull tensile tests were used to qualify the adhesive joint reliability and quality. From the results of the present work, it can be concluded that the anisotropically conductive adhesive A joints are stable in the 85°C/85% RH environment and therefore have better corrosion resistance than adhesive B joints. Neither of the adhesives can pass temperature cycling from −55 to 125°C for 1000 cycles according to military standard 883C.

Polymer thick film (PTF) technology provides the lowest cost, cleanest and most efficient manufacturing method for producing flexible circuits. Non‐contact radio frequency (RF) smart cards and related information transaction devices, such as RFID tags, appear to be a good fit for PTF‐flex. Flip chip also seems well suited for these “contactless” RF transceiver products. Flip chip and PTF adhesive technologies are highly compatible and synergistic. All PTF SMT adhesives assembly methods are viable for flip chip. However, the merging of flip chip with PTF‐flex presents major challenges in design, materials and processing. This paper will compare assembly methods and discuss obstacles and solutions for state‐of‐the‐art flip chip on flex within the RFID product environment.

The purpose of this paper is to examine electrical and mechanical properties of radio frequency identification (RFID) chip joints assembled on a flexible substrate and made from isotropic conductive adhesives (ICAs) reinforced with graphene nanoplatelets (GPNs) or graphite nanofibers (GFNs).

The ICAs reinforced with GPNs or GFNs were prepared and screen printed on a test pattern to investigate resistance and thickness of these adhesive layers. Differential Scanning Calorimetry (DSC) was performed to assess a curing behaviour of the prepared ICAs. Then, RFID chips were mounted with the prepared ICAs to the pattern of silver tracks prepared on foil. Shear test was carried out to evaluate mechanical durability of the created chip joints, and resistance measurements were carried out to evaluate electrical properties of the tested ICAs.

The 0.5 per cent (by weight) addition of GFNs or GPNs to the ICA improved shear force values of the assembled RFID chip joints, whereas resistance of these modified adhesives increased. The DSC analysis showed that a processing temperature of the tested adhesives may range from 80 to 170°C with different curing times. It revealed a crucial influence of curing time and temperature on electrical and mechanical properties of the tested chip joints. When the chip pads were cured for too long (i.e. 60 minutes), it resulted in a resistance increase and shear force decrease of the chip joints. In turn, the increase of curing temperature from 80 to 120°C entailed improvement of electrical and mechanical properties of the assembled chips. It was also found that a failure location changed from the chip – adhesive interface towards the adhesive – substrate one when the curing temperature and time were increased.

Further investigations are required to examine changes thoroughly in the adhesive reinforced with GFNs after a growth of curing time. It could also be worth studying electrical and mechanical properties of the conductive adhesive with a different amount of GFNs or GPNs.

The tested conductive adhesive reinforced with GFNs or GPNs can be applied in the production of RFID tags because it may enhance the mechanical properties of tags fabricated on flexible substrates.

Influence of GFNs and GPNs on the electrical and mechanical properties of commercial ICAs was investigated. These properties were also examined depending on a curing time and temperature. New conductive materials were proposed and tested for a chip assembly process in fabrication of RFID tags on flexible substrates.

Personal and portable electronic devices are becoming an important part of the everyday lives. Electronics miniaturization has been and continues to be the most important driver in this development. The current level of miniaturization has made the use of solder joints challenging and new methods, such as adhesive attachments, have been developed. The applicability of these methods depends crucially on their long‐term reliability. Typical failures mechanisms in adhesive connection include cracking, open joints and delamination. Moisture is the principal cause of failures in adhesive attachments. The purpose of this paper is to examine the long‐term effects of moisture and extended temperature on non‐conductive adhesive (NCA) attachments.

Moisture and extended temperature on NCA attachments are examined by strength tests and by finite element models.

The increase in temperature and moisture induces stresses on the interface of the adhesive and the chip. In the experiments, it is found that the adhesion strength of the adhesive decreased as a function of the time for which the samples are in a humid environment. Failures due to delamination are seen to be the result of these two mechanisms.

Reduction of pitch causes manufacturing problems in direct solder attachments. This paper examines a promising technique to overcome this problem by using adhesive attachment. Instead of solder joints in flip chip attachment, the chips can be attached to the substrate, or components can be attached to a printed wiring board, with adhesives.

During the last few years an increasing number of flip‐chip (FC) interconnection technologies have emerged. While flip‐chip assembly offers many advantages compared with conventional packaging techniques, several aspects prevent this technology from entering the high volume market. Among these are the availability of bumped chips and the costs of the substrates, i.e., ceramic substrates with closely matching coefficient of thermal expansion (CTE) to the chip, in order to maintain high reliability. Only recently, with the possibility of filling the gap between chip and organic substrate with an encapsulant, was the reliability of flip‐chips mounted on organic substrates significantly enhanced. This paper presents two approaches to a fluxless process, one based on soldering techniques using Au‐Sn metallurgy and the other on adhesive joining techniques. Soldering is performed with a thermode and with a laser based system. For both of these FC‐joining processes, alternative bump mettallurgies based on electroplated gold, electroplated gold‐tin, mechanical gold and electroless nickel gold bumps are applied.

Traditional B‐staged epoxy film adhesives have been used as substrate attach adhesive for hybrid circuits. The advantages of using film adhesive instead of paste adhesive are precise bond‐line, clean operation, ease of application for larger bonding area and possibility to automate the process for large volume production. Epoxy, in general, is more stable than polyurethane and is better in adhesion with no contamination problems in comparison with silicone. Traditional epoxy, however, has high bond strength and is therefore limited only to substrates with matched thermal expansion properties. Combining the advantages of excellent adhesion of epoxy and flexibility of rubbery substance, a low glass transition temperature (Tg) epoxy which is flexible in nature has been developed for bonding substrates with mis‐matched thermal expansion coefficient. The new epoxy adhesive is also designed to meet the requirements of MIL‐STD‐883C/5011 in application without sacrificing ionic purity, low outgassing, thermal conductivity and long‐term dielectric or conductive properties. The new flexible film adhesive, in both its insulating and conductive forms, has attracted new applications and designs that were not previously feasible. For example, the flexible film adhesive can be used to bond ceramic hybrids directly to a lower cost metal substrate such as aluminium or copper. Testing has been performed by users on the combination of alumina/aluminium for over 1000 thermal cyclings and shocks from −55 to 150°C for large area bonding (up to a maximum of 6 x 6 inches square). The cured flexible epoxy adhesive, while very pliable, also exhibits more than 1,000 to 2,000 psi lap‐shear strength (depending on the type of substrate) and withstands more than 15,000 g acceleration test.

This paper discusses flip chip on FR‐4 and ceramics using non‐conductive adhesive (NCA), anisotropic conductive film (ACF), or anisotropic conductive paste (ACP). Several ACF and ACP materials with different types of adhesive resin and conductive particles and one NCA material were evaluated. Flip chips were assembled on test vehicles for temperature cycling and high‐temperature high‐humidity tests. The reliability performance of the processes was compared. Flip chip processes using NCA, ACF, or ACP could give satisfactory reliability and high assembly yield for some applications, when the bonding parameters were optimised.

The purpose of this study is to investigate the reliability of flip chip joints made with anisotropic conductive adhesives (ACA) on flexible polyimide (PI) and liquid crystal polymer (LCP) substrates.

Six test series using two ACAs and an LCP substrate were made with varying bonding pressure. The ACAs had the same matrix and conductive particles. To lower the CTE of one of the adhesives silica had been added to it. The reliability of the test series was studied in a temperature cycling test. The purpose of these test series was to find the optimal bonding pressure for both the adhesives used. According to the results from these initial tests, further test series were made with both LCP and PI substrates. The reliability of these test samples was studied using a temperature cycling test and a constant humidity test. The adhesion strength of the joints was studied before testing.

Both substrates had excellent reliability during the temperature cycling test. However, the reliability of the PI substrates during the constant humidity test was markedly lower than that of the LCP substrates. Additionally, the adhesion strength of the adhesives on to PI substrates was clearly less.

The work shows how the substrate material used affects the reliability of flip chip joints. In addition, the work shows how the addition of silica to the ACA matrix affects the reliability of the joints.