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The purpose of this paper is to investigate the effect of geometric size on intermetallic compound (IMC) growth and elements diffusion of Cu/Sn/Cu solder joint and establish the correlation model between the thickness of the IMC layer and size of the solder joint on the dozens of microns scale.

The sandwich-structured Cu/Sn/Cu solder joints with different gaps between two copper-clad plates (δ) are fabricated using a reflow process. The microstructure and composition of solder joints are observed and analyzed by scanning electron microscopy.

After reflow, the thickness of the IMC and Cu concentration in solder layers increase with the reduction of δ from 50, 40, 30, 20 to 10 μm. During isothermal aging, the thickness of the IMC fails to increase according to the traditional parabolic rule due to changes in Cu concentration. The reduction of δ is the root cause of changes in Cu concentration and the growth rule of the IMC layer. A correlation model between the thickness of the IMC layer and δ is established. It is found that the thickness of the IMC layer is the function of aging time and δ. With δ reducing, the main control element of IMC growth transfers from Cu to Sn.

This paper shows the changes of IMC thickness and elements concentration with the reduction of the size of solder joints on the dozens of microns scale. A correlation model is established to calculate the thickness of the IMC layer during aging.

The relentless drive towards greater complexity and interconnection density on silicon integrated circuit (SIC) devices is leading to a reappraisal of techniques for making electrical connections from the SIC to the next level of packaging. The techniques being examined include fine pitch Wire Bonding, Tape Automated Bonding (TAB) and Flip‐chip Solder Bonding. This latter technique forms the subject of this paper. The history of flip‐chip solder bonding technology is briefly reviewed and metallurgical, physical and mechanical aspects of the bonding process and of the resulting joints are discussed. The merits of the flip‐chip bonding process are indicated and applications examples presented. Particular attention is given to the fabrication of a novel pyroelectric‐SIC thermal imaging sensor using flip‐chip solder bonding.

An overview has been presented on the topic of alternative surface finishes for package I/Os and circuit board features. Aspects of processability and solder joint reliability were described for the following coatings: baseline hot‐dipped, plated, and plated‐and‐fused 100Sn and Sn‐Pb coatings; Ni/Au; Pd, Ni/Pd, and Ni/Pd/Au finishes; and the recently marketed immersion Ag coatings. The Ni/Au coatings appear to provide the all‐around best options in terms of solderability protection and wire bondability. Nickel/Pd finishes offer a slightly reduced level of performance in these areas which is most likely due to variable Pd surface conditions. It is necessary to minimize dissolved Au or Pd contents in the solder material to prevent solder joint embrittlement. Ancillary aspects that include thickness measurement techniques; the importance of finish compatibility with conformal coatings and conductive adhesives; and the need for alternative finishes for the processing of non‐Pb bearing solders are discussed.

The purpose of this paper is to present a failure analysis of the solder layer in a Darlington power transistor in a TO-3 package.

A failed Darlington power transistor in a TO-3 package was examined by different kinds of failure analysis techniques. At first, internal gas analysis was conducted to measure the atmosphere. Then, scanning acoustic microscopy (SAM) was performed to check the quality of the solder layers in the failed device, and the failure location was determined in the solder layer between chip and substrate. Next, the failed device was decapped to observe the defects. After removing the chip from the substrate, energy dispersive spectroscopy (EDS) and X-ray photoelectron spectroscopy (XPS) were applied and the main elemental composition of the solder layer was identified.

Internal gas analysis indicated that the moisture and oxygen contents exceeded the allowed maximum value. Large areas of voids were found in the solder layer by SAM. The main elemental compositions of the solder layer were identified by scanning electron microscopy and EDS. Furthermore, the valences of the chemical components in the solder layer were identified by XPS. Except for the few simple substances of the initial solder material, the chemical formulae of oxidation products in the solder layer were deduced. In addition, the root causes are also discussed.

This paper focuses on the solder layer failure of a power transistor. Factors such as the presence of oxygen, voids and other factors, which can cause transistor damage, were comprehensively analyzed. The analysis process is worth learning from and the results can be used to improve the reliability of power devices in this kind of package.

This study aims to investigate the effect of bismuth addition (up to 30 Wt%) on the microstructure and electrical conductivity of a commercial lead-free alloy (SAC405) near the solder/substrate soldered joint. The system under study is referred in this work as (SAC405 + xBi)/Cu, as Cu is the selected substrate in which the solder was casted. The electrical resistivity of this system was investigated, considering Bi addition effect on the local microstructure and chemical composition gradients within that zone.

Solder joints between Cu substrate and SAC405 alloy with different levels of Bi were produced. The electrical conductivity along the obtained solder/substrate interface was measured by four-point probe method. The microstructure and chemical compositions were evaluated by scanning electron microscopy/energy dispersive spectroscopy analysis.

Two different electrical resistivity zones were identified within the solder interface copper substrate/solder alloy. At the first zone (from intermetallic compound [IMC] until approximately 100 μm) the increase of the electrical resistivity is gradual from the substrate to the solder side. This is because of the copper substrate diffusion, which established a chemical composition gradient near the IMC layer. At the second zone, electrical resistivity becomes much higher and is mainly dependent on the Bi content of the solder alloy. In both identified zones, electrical resistivity is affected by its microstructure, which is dependent on Cu and Bi content and solidification characteristics.

A detailed characterization of the solder/substrate zone, in terms of electrical conductivity, was done with the definition of two variation zones. With this knowledge, a better definition of processing parameters and in-service soldered electronic devices behavior can be achieved.

The reactions between Sn–Ag–Cu lead‐free solders of various compositions and Au/Ni surface finish in advanced electronic packages were studied. Three solder compositions, Sn–3.5Ag, Sn4Ag–0.5Cu, and Sn–3.5Ag‐0.75Cu were used, and their performance was compared. It was found that the Sn–4Ag–0.5Cu solder gave the worst results in terms of shear strength. The poor performance of the Sn–4Ag–0.5Cu solder can be explained based on its microstructure. The types of intermetallic compounds formed at the interface were different for different solder compositions. When there was no Cu the reaction product was Ni₃Sn₄. For the Sn–3.5Ag–0.75Cu solder, the reaction product was (Cu_1‐p‐qAu_pNi_q)₆Sn₅ immediately after reflow, and two intermetallic compounds (Cu_1‐p‐qAu_pNi_q)₆Sn₅ and (Ni_1‐yCu_y)₃Sn₄ formed after aging at 180°C for 250 and 500 h. For the Sn–4Ag–0.5Cu solder, both Ni₃Sn₄ and (Cu_1‐p‐qAu_pNi_q)₆Sn₅ were present near the interface right after reflow, and there was a layer of solder between these two intermetallic compounds.

The purpose of this paper is to develop a new composite solder to improve the reliability of composite solder joints. Nano-particles modified multi-walled carbon nanotubes (Ni-MWCNTs) can indeed improve the microstructure of composite solder joints and improve the reliability of solder joints. Although many people have conducted in-depth research on the composite solder of Ni-MWCNTs. However, no one has studied the performance of Ni-MWCNTs composite solder under different aging conditions. In this article, Ni-MWCNTs was added to Sn-Ag-Cu (SAC) solder, and the physical properties of composite solder, the microstructure and mechanical properties were evaluated.

In this study, the effect of different aging conditions on the intermetallic compound (IMC) layer growth and shear strength of Ni-modified MWCNTs reinforced SAC composite solder was studied. Compared with SAC307 solder alloy, the influence of Ni-MWCNTs with different contents (0, 0.1 and 0.2 Wt.%) on composite solder was examined. To study the aging characteristics of composite solder joints, the solder joints were aged at 80°C, 120°C and 150°C.

The experimental results show that the content of Ni-MWCNTs affects the morphology and growth of the IMC layer at the interface. The microhardness of the solder increases and the wetting angle decreases. After aging at moderate (120°C) and high temperature (150°C), the morphology of the Cu6Sn5 IMC layer changed from scallop to lamellar and the grain size became coarser. The following two different phase compositions were observed in the solder joints with Ni-MWCNTs reinforcement: Cu3Sn and (Cu, Ni)6Sn5. The fracture surface of the solder joints all appeared ductile dents, and the size of the pits increased significantly with the increase of the aging temperature. Through growth kinetic analysis, Ni-modified MWCNTs in composite solder joints can effectively inhibit the diffusion of atoms in solder joints. In short, when the addition amount of Ni-MWCNTs is 0.1 Wt.%, the solder joints exhibit the best wettability and the highest shear strength.

In this study, the effects of aging conditions on the growth and shear strength of the IMC layer of Ni modified MWCNTs reinforced SAC307 composite solder were studied. The effects of Ni MWCNTs with different contents (0, 0.1 and 0.2 Wt.%) on the composite solder were examined.

The surface finish is an essential step in printed circuit boards design because it provides a solderable surface for electronic components. The purpose of this study to investigate the effects of different surface finishes during the soldering and ageing process.

The solder joints of Sn-4.0Ag-0.5Cu/Cu and Sn-4.0Ag-0.5Cu/electroless nickel/immersion silver (ENImAg) were investigated in terms of intermetallic (IMC) thickness, morphology and shear strength. The microstructure and compositions of solder joints are observed, and analyzed by using scanning electron microscopy (SEM-EDX) and optical microscope (OM).

Compounds of Cu₆Sn₅ and (Cu, Ni)₆Sn₅ IMC were formed in SAC405/Cu and SAC405/ENImAg, respectively, as-reflowed. When the sample was exposed to ageing, new layers of Cu₃Sn and (Ni, Cu)₃Sn₅ were observed at the interface. Analogous growth in the thickness of the IMC layer and increased grains size commensurate with ageing time. The results equally revealed an increase in shear strength of SAC405/ENImAg because of the thin layer of IMC and surface finish used compared to SAC405/Cu. Hence, a ductile fracture was observed at the bulk solder. Overall, the ENImAg surface finish showed excellent performance of solder joints than that of bare Cu.

The novel surface finish (ENImAg) has been developed and optimized. This alternative lead-free surface finish solved the challenges in electroless nickel/immersion gold and reduced cost without affecting the performance.

The purpose of this paper is to investigate the wettability and intermetallic (IMC) layer formation of Sn-3.0Ag-0.5Cu (SAC305)/CNT/Cu solder joint according to the formulation of solder paste because of different types of fluxes.

Solder pastes were prepared by mixing SAC305 solder powder with different flux and different wt.% of carbon nanotube (CNT). Fourier transform infrared spectroscopy was used to identify functional groups from different fluxes of as-formulated solder paste. The solder pastes were then subjected to stencil printing and reflow process. Solderability was investigated via contact angle analysis and the thickness of cross-sectionally intermetallic layer.

It was found that different functional groups from different fluxes showed different physical behaviour, indicated by contact angle value and IMC layer thickness. “Aromatic contain” functional group lowering the contact angle while non-aromatic contain functional group lowering the thickness of IMC layer. The higher the CNT wt.%, the lower the contact angle and IMC layer thickness, regardless of different fluxes. Relationship between contact angle and IMC layer thickness is found to have distinguished region because of different fluxes. Thus it may be used as guidance in flux selection for solder paste formulation.

However, detail composition of the fluxes was not further explored for the scope of this paper.

The quality of solder joint of SAC305/CNT/Cu system, as indicated by contact angle and the thickness of IMC layer formation, depends on existence of functional group of the fluxes.

The purpose of this paper is to investigate the influence of praseodymium (Pr) additions (0, 0.05 and 0.5 wt%) on the mechanical properties and microstructure of SnAgCu solder joint during aging process. Moreover, the authors aim to indicate that the decreased soldification undercooling of Sn3.8Ag0.7Cu solder can suppress the formation of Ag3Sn plate to some extent.

The shear strength evolution of SAC, SAC‐0.05Pr and SAC‐0.5Pr solder joint were studied under 150°C aging process with STR‐1000. The effect of Pr additions on the solidification behavior of SnAgCu solder was also studied by differential scanning calorimetry. To study the microstructure evolution, the cross‐sections of all specimens were observed by means of scanning electron microscope (SEM) and energy dispersive spectroscopy (EDS). Meanwhile, the etchant, consisting of 20%HNO3+distilled water was used for deep etching to reveal the interfacial morphology.

The shear force reduction rate of SAC solder joint during aging was restrained by 0.05%Pr addition but promoted with 0.5% Pr addition. The growth of IMC layer of SnAgCu joint in the aging process was suppressed significantly by different amounts of Pr additions. However, the beneficial effect of Pr addition due to the suppression of IMC layer growth was weakened by the micro‐cracks formed in PrSn3 compounds in SnAgCu‐0.5Pr joint. Pr additions (0.05, 0.5 wt%) decrease the solidification undercooling of SnAgCu solder, which will suppress the formation of Ag3Sn plate to some extent.

Further studies are necessary for confirmation of the practical application, especially of the manufacturing technology of solder paste containing Pr.

The appropriate amount of Pr in Sn3.8Ag0.7Cu solder is about 0.05 wt%. It is found that SAC‐0.05Pr solder has an improvement in solder joint reliability in long aging processes. The results suggested the novel solder alloys can meet the requirements of high reliability application.

The paper demonstrates that: Pr additions promote the solidification of SAC solder; shear force reduction rate of SAC solder joint was reduced by 0.05%Pr addition; the IMC layer growth rate of SnAgCu solder joint was suppressed by Pr additions; and micro‐cracks were found in PrSn3 phases after aging.