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The purpose of this paper is to attempt to study the failure mechanism of BGA (ball grid array) Cu wire bond ball lift and specifically focused on substrate outgassing’s impact on Cu wire bonding quality and reliability.

The Galvanic corrosion theory has been widely adopted in explaining the failure mechanism of Cu ball bond lift issue during reliability test or field application in the presence of moisture. In this study, ion chromatography was performed on BGA substrate halogen analysis. EDX (energy-dispersive X-ray spectroscopy) was also used to detect the contaminant’s element at the bottom surface of a window clamp. Further FTIR (Fourier transform infrared spectroscopy) analysis verified that the contamination is from substrate outgassing during wire bonding. A new window clamp design proved effective in reducing the negative impact from substrate outgassing during wire bonding.

The solder mask in a fresh substrate contains a chlorine element. The chlorine can be detected in the BGA substrate outgassing during wire bonding by FTIR and EDX analyses, which have a negative impact on the Cu wire bonding. The window clamp with a larger opening can reduce the negative impact of the Cu wire bonding from the BGA substrate outgassing.

Because of the limitation of time and resources, bonding pad surface contamination from substrate outgassing and its correlation with Cu bonding ball lift failure after reliability test will be studied in depth later.

The BGA substrate outgassing has negative impacts on Cu wire bondability. A window clamp with a larger opening can reduce the negative impact from substrate outgassing.

Voiding in BGA assembly using SN63 solder bumps is primarily introduced at board‐level assembly stage. On the pretinned PCBs, voiding of BGA joints increases with increasing solvent volatility, increasing metal content and increasing reflow temperature, and with decreasing powder size. This can be explained by a viscosity dictated flux‐exclusion‐rate model. In this model, a higher viscosity in the fluxing medium at reflow temperature could hinder the exclusion of flux from the interior of the molten solder, hence increase the chance of outgassing due to the increasing amount of entrapped flux, and consequently result in higher voiding in BGA assembly. Flux activity and reflow atmosphere appear to have a negligible effect on voiding when the solderability of the immobile metallisation is not a concern. An increase in void content is accompanied by an increase in the fraction of large voids. This suggests that, similar to voiding phenomena in the SMT process, factors causing voiding in BGA will have an even greater impact on joint reliability than shown by the total‐void‐volume analysis results.

The vacuum vapour phase soldering method was investigated by numerical simulations. The purpose of this study was to examine the temperature changes of the solder joints during the vapour suctioning process. A low pressure is used to enhance the outgassing of the trapped gas within the solder joints, which otherwise could form voids. However, the system loses heat near the suction pipe during the suctioning process, and it can result in preliminary solidification of the solder joints before the gas could escape.

A three-dimensional numerical flow model based on the Reynolds averaged Navier–Stokes equations with the standard k-e turbulence method was developed. The effect of the vapour suctioning on the convective heat transfer mechanism was described by the model. Temperature change of the solder joints was studied at the mostly used substrate and component combinations, as well as at different system settings.

In the function of the substrate thickness and the component size, the solder joints can lose large amount of heat during the void reduction process, which leads to preliminary solidification before the entrapped gas voids could be removed.

The results provide setting information of vacuum vapour phase technology for appropriate and optimal applications.

The relationship between low pressure generation and convective heat transfer mechanism during vacuum vapour phase soldering has not been studied yet. The possible negative effects of the vapour suctioning process on the solder joint temperature are unknown.

This paper aims to investigate the effects of different ultrasonic-assisted loading degrees on the microstructure, mechanical properties and the fracture morphology of Cu/Zn+15%SAC0307+15%Cu/Al solder joints.

A new method in which 45 μm Zn particles were mixed with 15% 500 nm Cu particles and 15% 500 nm SAC0307 particles as solders (SACZ) and five different ultrasonic loading degrees were applied for realizing the soldering between Cu and Al at 240 °C and 8 MPa. Then, SEM was used to observe and analyze the soldering seam, interface microstructure and fracture morphology; the structural composition was determined by EDS; the phase of the soldering seam was characterized by XRD; and a PTR-1102 bonding tester was adopted to test the average shear strength.

The results manifest that Al–Zn solid solution is formed on the Al side of the Cu/SACZ/Al joints, while the interface IMC (Cu₅Zn₈) is formed on the Cu side of the Cu/SACZ/Al joints. When single ultrasonic was used in soldering, the interface IMC (Cu₅Zn₈) gradually thickens with the increase of ultrasonic degree. It is observed that the proportion of Zn or ZnO areas in solders decreases, and the proportion of Cu–Zn compound areas increases with the variation of ultrasonic degree. The maximum shear strength of joint reaches 46.01 MPa when the dual ultrasonic degree is 60°. The fracture position of the joint gradually shifts from the Al side interface to the solders and then to the Cu side interface.

The mechanism of ultrasonic action on micro-nanoparticles is further studied. By using different ultrasonic loading degrees to realize Cu/Al soldering, it is believed that the understandings gained in this study may offer some new insights for the development of low-temperature soldering methodology for heterogeneous materials.

A study was conducted to examine the sensitivity of solder joint integrity for PBGA assembly and post rework process yields to the change of the solder ball coplanarity specification from 0.15mm to 0.20mm as well as to increase the level of confidence with respect to the specification change. The study considered the following experimental variables: solder ball coplanarity; stencil thickness and aperture design; whether the assembly also experiences a wave soldering process; the rework method, i.e. whether there is dispensing of solder paste or just a flux. Electrical continuity tests were performed after PBGA assembly and rework. Accelerated thermal cycling and thermal shock tests were then used to evaluate the solder joint reliability. Additionally, standoff heights of PBGA solder joints were measured through cross sectioning samples. Statistical comparisons of the mean standoff height between different PBGA coplanarity groups, where different experiment variables were applied, allowed for determination of the variation of BGA solder joint integrity.

The aim of this paper is to evaluate using statistical methods how two soldering techniques – the convection reflow and vapour phase reflow with vacuum – influence reduction of voids in lead-free solder joints under Light Emitted Diodes (LEDs) and Ball Grid Arrays (BGAs).

Distribution of voids in solder joints under thermal and electrical pads of LEDs and in solder balls of BGAs assembled with convection reflow and vapour phase reflow with vacuum has been investigated in terms of coverage or void contents, void diameters and number of voids. For each soldering technology, 80 LEDs and 32 solder balls in BGAs were examined. Soldering processes were carried out in the industrial or semi-industrial environment. The OM340 solder paste of Innolot type was used for LED soldering. Voidings in solder joints were inspected with a 2D X-ray transmission system. OriginLab was used for statistical analysis.

Investigations supported by statistical analysis showed that the vapour phase reflow with vacuum decreases significantly void contents and number and diameters of voids in solder joints under LED and BGA packages when compared to convection reflow.

Voiding distribution data were collected on the basis of 2D X-ray images for test samples manufactured during the mass production processes. Statistical analysis enabled to appraise soldering technologies used in these processes in respect of void formation.

The trend towards higher density, higher frequency, higher power active devices in placing increasingly difficult demands on device packaging. Materials with high thermal conductivities are replacing the traditional ceramics in hermetic, high power packages, and MCM/ hybrid modules. Thermally enhanced plastic packages more frequently feature heat sinks embedded in the package for direct attachment of the power devices. Today's challenge in electronic packaging is to dissipate the heat from the source, the device itself, without affecting its electrical performance or reliability. The material directly contacting the device is the die attach medium. On lower power packages, the die bond line is not usually the highest thermal resistance in the thermal path. With highly conductive substrates and heat sinks, the die attach material now becomes the critical element directly in series with the highly conductive substrate. Fundamental limitations in thermal properties of about 3 W/mK exist in present‐day organic adhesives, primarily of the thermosetting type. This thermal conductivity (k) does not meet the current demands of thermally enhanced plastic laminate packages, MCMs, or direct die attach to heat spreaders or heat sinks. This paper describes the development, properties and application of electrically conductive thermoplastic adhesive pastes having thermal conductivity values as high as 35 W/mK, and able to produce thin, void‐free bond lines for maximum thermal transfer. The key material variables are isolated and evaluated for their impact of the k value. DOEs (design of experiments) were run to optimise the combination of the key variables, namely size/shape of the filler and the volume fraction to produce the highest k without sacrificing other functional properties such as adhesion. The effect of polymer chemistry (thermoset and thermoplastic) was also studied. The properties of the newly developed, enhanced conductivity thermoplastic adhesives are compared with other material technologies and examples of current applications reviewed.

The purpose of this paper is to propose a solution procedure to minimize/eliminate voiding and spattering defects in the assembly of 0201 chip components with micro via‐in pads and 95 wt.%Sn‐5 wt.%Sb solder alloy.

In total, four different micro via‐in pad designs were compared (via‐hole opening size): ultra small via‐in pads (d: 10 μm), small via‐in pads (d: 20 μm), and large via‐in pads (d: 60 μm), as well as designs with no via‐in pads and capped via‐in pads. Two process variables were also evaluated for the goal of achieving a high‐yield assembly solution in micro via‐in pad and lead‐free solder systems. Potential factors, such as the preheat conditions of the reflow profile and stencil aperture size, which might affect voiding and spattering in solder joints with micro via‐in pad, were investigated. Solder voiding frequency and size were also determined from X‐ray inspection and sample cross‐section analysis.

The results indicated that larger via‐holes were seen to create bigger voiding than smaller via‐holes. For smaller via‐holes, spattering is a greater problem than voiding in solder joints. Ultra small via‐in pads generated higher spattering compared to no via‐in pads and capped via‐in pads. Capped via‐in pads exhibited the best results in preventing voiding and flux spattering, and provided a wide process window for the selection of process parameters. It is also indicated that spattering was found to rapidly reduced with both increasing stencil opening size and use of reflow profile with long‐preheat conditions.

The findings provide certain process guidelines for surface‐mount assembly with via‐in pad substrate design. The strategy is to prevent voiding and spattering by adopting capped via‐in pads, if possible, when applying micro via with the 95 wt.%Sn‐5 wt.%Sb solder alloy system.

As plastic ball grid array (PBGA) components proliferate, card assembly questions arise about the robustness of the module to card attachment process. A designed experiment was performed to measure the sensitivity of card assembly yields to normal assembly process variation. Experimental variables include card thickness, ball pad size on the card ball grid array (BGA) site, module moisture exposure and ball planarity of a 225 I/O PBGA. Another set of PBGA test cards, assembled under optimum process conditions, was subjected to accelerated thermal cycle (ATO) testing. ATC testing also included a rework cell. Overall, the PBGA module attachment process demonstrated robustness. The initial attach and reworked modules proved to be reliable. This paper focuses on the details of the test conditions and the results.