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Article
Publication date: 15 February 2019

Muhammad Nubli Zulkifli, Fuaida Harun and Azman Jalar

This paper aims to analyze the effect of surface roughness and hardness of leadframe on the bondability of gold (Au) wedge bond using in situ inspection of laser interferometer…

Abstract

Purpose

This paper aims to analyze the effect of surface roughness and hardness of leadframe on the bondability of gold (Au) wedge bond using in situ inspection of laser interferometer and its relationship with the deformation and wire pull strength.

Design/methodology/approach

The in situ inspection of ultrasonic vibration waveform through the changes of vertical axis (y-axis) amplitude of wire bonder capillary was carried out using laser interferometer to analyze the formation of Au wedge bond. The relationship between the changes of ultrasonic waveform of capillary with the deformation and the pull strength was analyzed to evaluate the bondability of Au wedge bonds.

Findings

It was observed that the changes in vertical axis amplitude of ultrasonic vibration waveform of wire bonder capillary can be used to describe the process of bonding formation. The loss of ultrasonic energy was exhibited in ultrasonic vibration waveform of wire bonding on leadframe that has higher value of roughness (leadframe A) as compared to that of leadframe that has lower value of roughness (leadframe B). The lower pull strength obtained by Au wedge bond further confirms the reduction of bond formation because of the higher deformation on leadframe A as compared to that of leadframe B.

Originality/value

The relationship between in situ measurement using laser interferometer with the bondability or deformation and wire pull strength of Au wedge bonds on different surface roughness and hardness of leadframes is still lacking. These findings provide a valuable data in analyzing the bonding mechanisms that can be identified based on the in situ measurement of ultrasonic vibration and the bondability of Au wedge bonds.

Details

Microelectronics International, vol. 36 no. 2
Type: Research Article
ISSN: 1356-5362

Keywords

Article
Publication date: 1 February 1988

L. Tielemans

An evaluation of the feasibility of copper ball‐wedge bonding on Au, Cu thick film and aluminium metallisations was carried out. This evaluation is not merely a check for…

Abstract

An evaluation of the feasibility of copper ball‐wedge bonding on Au, Cu thick film and aluminium metallisations was carried out. This evaluation is not merely a check for feasibility, but will also give more insight into the problems concerning copper ball‐wedge bonding. This article does not pretend to represent profound research on copper ball bonding, but will give qualitative insight. Copper ball bonding, without using cover gas, is possible, but the bond quality decreases. Extrusion and penetration of the ball bond in the substrates are caused by the hardness of the copper. This can only be avoided when the hardness of the substrate is matched to the hardness of the copper ball/wire. Bonding mechanisms are similar for bonding on thick film to those for bonding on metallisations. Matching hardness of the substrate to the ball/wire seems to be a necessity for proper ball‐wedge bonding.

Details

Microelectronics International, vol. 5 no. 2
Type: Research Article
ISSN: 1356-5362

Article
Publication date: 5 January 2015

Fuaida Harun, Roslina Ismail, Azman Jalar and Shahrum Abdullah

– This paper aims to analyze the effect of Au wire size and location of hook during wire pulling test to identify the variation of results obtained.

Abstract

Purpose

This paper aims to analyze the effect of Au wire size and location of hook during wire pulling test to identify the variation of results obtained.

Design/methodology/approach

Two hook locations, namely, location A and location B were used to analyze the effect of hook location. Location A was the same as the hook location required by MIL-STD-883E standard, whereas location B was located near to the second bond. The correlation between new purposed failure modes and MIL-STD-883E standard was developed to reflect on the pull strength with the physical failure.

Findings

It was observed that fine pitch Au wire has higher variation and lower process capability of pull strength. Au wire pulled by the hook at location B provides a more representative result compared to that at location A. Fifty per cent or more of Au remnant is required to be considered as a good and reliable Au wedge bond based on the new purposed failure modes.

Originality/value

The evaluation of gold (Au) wedge bond requires a new proper wire pulling test method. This is due to the large variation obtained from the application of current practice of wire pulling test.

Details

Microelectronics International, vol. 32 no. 1
Type: Research Article
ISSN: 1356-5362

Keywords

Article
Publication date: 1 March 1987

S.T. Riches and G.L. White

GaAs electronic devices are becoming increasingly used in the microelectronics industry especially in solid state microwave, ultra high speed digital processing and optoelectronic…

Abstract

GaAs electronic devices are becoming increasingly used in the microelectronics industry especially in solid state microwave, ultra high speed digital processing and optoelectronic applications. However, in the manufacture of the GaAs devices, problems due to the inherent brittleness of the GaAs and batch to batch variability of the bond pad metallisation have commonly been experienced. This has resulted in some difficulties in wire bonding to GaAs devices with ultrasonic and thermocompression wire bonding techniques. This paper describes a programme undertaken to investigate Au wire bonding techniques to GaAs devices. Specifically, bonding trials have been performed on a range of GaAs substrates using pulse tip and continuously heated thermocompression bonding and ultrasonic bonding. The results of this work have shown that thermocompression and ultrasonic wire bonding techniques are cabable of producing acceptable bonds to GaAs devices, although some of the advantages and limitations of each technique have been demonstrated. Thermocompression bonding with a continuously heated capillary gave the most tolerant envelope of bonding conditions and highest bond strengths. Pulse tip thermocompression bonding gave a less tolerant envelope of acceptable bonding conditions, required a longer bonding time and the wire was weakened above the ball bond. Ultrasonic bonding did not require any substrate heating to give acceptable bonds. However, the choice of equipment can be critical if damage to the device is to be avoided.

Details

Microelectronics International, vol. 4 no. 3
Type: Research Article
ISSN: 1356-5362

Article
Publication date: 1 March 1999

Paul T. Vianco

An overview has been presented on the topic of alternative surface finishes for package I/Os and circuit board features. Aspects of processability and solder joint reliability…

1318

Abstract

An overview has been presented on the topic of alternative surface finishes for package I/Os and circuit board features. Aspects of processability and solder joint reliability were described for the following coatings: baseline hot‐dipped, plated, and plated‐and‐fused 100Sn and Sn‐Pb coatings; Ni/Au; Pd, Ni/Pd, and Ni/Pd/Au finishes; and the recently marketed immersion Ag coatings. The Ni/Au coatings appear to provide the all‐around best options in terms of solderability protection and wire bondability. Nickel/Pd finishes offer a slightly reduced level of performance in these areas which is most likely due to variable Pd surface conditions. It is necessary to minimize dissolved Au or Pd contents in the solder material to prevent solder joint embrittlement. Ancillary aspects that include thickness measurement techniques; the importance of finish compatibility with conformal coatings and conductive adhesives; and the need for alternative finishes for the processing of non‐Pb bearing solders are discussed.

Details

Circuit World, vol. 25 no. 1
Type: Research Article
ISSN: 0305-6120

Keywords

Article
Publication date: 23 January 2009

Z.W. Zhong

This paper attempts to review recent advances in wire bonding using copper wire.

2077

Abstract

Purpose

This paper attempts to review recent advances in wire bonding using copper wire.

Design/methodology/approach

Dozens of journal and conference articles published recently are reviewed.

Findings

The problems/challenges such as wire open and short tail defects, poor bondability for stitch/wedge bonds, oxidation of Cu wire, strain‐hardening effects, and stiff wire on weak support structures are briefly analysed. The solutions to the problems and recent findings/developments in wire bonding using copper wire are discussed.

Research limitations/implications

Because of page limitation of the paper, only a brief review is conducted. Further reading is needed for more details.

Originality/value

This paper attempts to provide introduction to recent developments and the trends in wire bonding using copper wire. With the references provided, readers may explore more deeply by reading the original articles.

Details

Microelectronics International, vol. 26 no. 1
Type: Research Article
ISSN: 1356-5362

Keywords

Article
Publication date: 1 September 1999

Chonglun Fan, Joseph A. Abys and Alan Blair

Palladium surface finishes are utilized on leadframes, printed wiring boards and automobile sensors. Their superior functional performance and the considerable environmental…

Abstract

Palladium surface finishes are utilized on leadframes, printed wiring boards and automobile sensors. Their superior functional performance and the considerable environmental impact of plating lead‐free finishes for packaging processes have been increasingly recognized by the electronic industry. Wire bondable and solderable palladium finishes meet military and industrial standards at no extra cost in the overall assembly processes when compared to traditional packaging techniques. In addition to the development of palladium plating chemistries and technologies, the functional properties of the surface finishes including their wire bonding performance have also been investigated at Bell Laboratories. In this study, gold and aluminum wire bonding to palladium finishes was tested and the wire bond pull force and break position were examined in order to optimize the bonding processes. The results of the study are reported in this paper.

Details

Circuit World, vol. 25 no. 3
Type: Research Article
ISSN: 0305-6120

Keywords

Article
Publication date: 1 January 1986

After many very successful years as a researcher and manager at British Telecommunications Research Laboratories, Nihal Sinnadurai has moved over to consultancy with BPA…

Abstract

After many very successful years as a researcher and manager at British Telecommunications Research Laboratories, Nihal Sinnadurai has moved over to consultancy with BPA (Technology & Management) Ltd.

Details

Microelectronics International, vol. 3 no. 1
Type: Research Article
ISSN: 1356-5362

Article
Publication date: 26 July 2013

Fei Zong, Zhi‐jie Wang, Yan‐bo Xu, Ji‐yong Niu and Han‐min Zhang

The purpose of this paper was to attempt to confirm the root cause of unstable stitch pull strength in PQFN package and propose some permanent solutions for it.

Abstract

Purpose

The purpose of this paper was to attempt to confirm the root cause of unstable stitch pull strength in PQFN package and propose some permanent solutions for it.

Design/methodology/approach

A screen experiment was designed to find the key process out of the manufacturing flow; a non‐destructive detaching method and cross section polishing were used to inspect the bond integrity; Auger analysis assisted with argon ion sputter was tried to confirm the contamination; finally the manufacturing processes were redesigned to prevent the contamination.

Findings

Some first aids of process optimization got little improvement; the screen experiment of processes found solder die bonding was the one resulted into a poor bond integrity which was demonstrated by non‐destructive detaching method and cross section inspection; Auger analysis assisted with argon ion sputter detected that there was a tin layer thicker than 20 nm coated on the bonding surface and the wire bondability of gold wire on this tin coating was poor; the lead frame was redesigned to prevent the wetting and flowing of tin and got a perfect performance.

Research limitations/implications

Because of the limitation of time and resources, the proposed solutions for this issue could be studied more deeply.

Originality/value

This paper set up an example how to find out the root cause from the complex manufacturing process flow and put forward a quick solution accordingly for the issue.

Details

Microelectronics International, vol. 30 no. 3
Type: Research Article
ISSN: 1356-5362

Keywords

Article
Publication date: 1 December 2000

Achim Köhler and Peter Dullenkopf

The realization of thick‐film circuits on glass substrates is discussed. Within the large number of commercially available thick‐film pastes, suitable pastes for thick‐film…

Abstract

The realization of thick‐film circuits on glass substrates is discussed. Within the large number of commercially available thick‐film pastes, suitable pastes for thick‐film conductors, resistors and dielectrics on glass substrates have been found. Experimental results for these pastes are presented. Finally two applications for thick‐film on glass technology are demonstrated.

Details

Microelectronics International, vol. 17 no. 3
Type: Research Article
ISSN: 1356-5362

Keywords

1 – 10 of 118