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Significant achievements in ferrite material processing enable developments of many ferrite devices with a wide range of power levels and working frequencies, which make…
Significant achievements in ferrite material processing enable developments of many ferrite devices with a wide range of power levels and working frequencies, which make demands for new characterization and modelling methods for ferrite materials and components. The purpose of this paper is to introduce a modelling and measurement procedure, which can be used for the characterization of two‐port ferrite components in high frequency range.
This paper presents a commercially available ferrite component (transformer) modelling and determination of its electrical parameters using in‐house developed software. The components are measured and characterized using a vector network analyzer E5071B and adaptation test fixture on PCB board. The parameters of electrical equivalent circuit of the ferrite transformer parameters are compared with values extracted out of measured scattering parameters.
A good agreement between modelled and extracted electrical parameters of the ferrite transformer is found. The modelled inductance curves have the same dependence versus frequency as extracted ones. That confirms the model validity in the wide frequency range.
In‐house developed software based on proposed model provides inclusion of the ferrite material dispersive characteristics, which dominantly determines high‐frequency behaviour of two‐port ferrite components. Developed software enables fast and accurate calculation of the ferrite transformer electrical parameters and its redesign in order to achieve the best performance for required application.
The appropriate selection of a testing method largely determines the accuracy of a measurement. Parasitic effects associated with test fixture demand a significant…
The appropriate selection of a testing method largely determines the accuracy of a measurement. Parasitic effects associated with test fixture demand a significant consideration in a measurement. The purpose of this paper is to introduce a measurement procedure which can be used for the characterization of surface mount devices (SMD) components, especially devoted to SMD inductors.
The paper describes measurement technique, characterization, and extracting parameters of SMD components for printed circuit board (PCB) applications. The commercially available components (multi‐layer chip SMD inductors in the ceramic body) are measured and characterized using a vector network analyzer E5071B and adaptation test fixture on PCB board. Measurement results strongly depend on the choice of the PCB; the behaviour of the component depends on the environment where the component is placed.
The equivalent circuit parameters are extracted in closed form, from an accurate measurement of the board‐mounted SMD inductor S‐parameters, without the necessity for cumbersome optimization procedures, which normally follow the radio frequency circuit synthesis.
It this paper, a new adaptation test fixture in PCB technology is realized. It is modeled and it has provided the extraction of parameters (intrinsic and extrinsic) of SMD inductor with great accuracy.