Optimizing the Operating Conditions of a Molybdenum Target Total Reflection X‐Ray Fluorescence (TXRF) Spectrometer Using a Computer Model

O.O. Adejumo (Department of Physics,The Polytechnic, Ibadan, Nigeria)
J.O. Ojo (Department of Physics, Obafemi Awolowo University, Ile‐Ife, Nigeria)

Multidiscipline Modeling in Materials and Structures

ISSN: 1573-6105

Publication date: 1 January 2007

Abstract

The results of trial experiments carried out with a computer simulation model of total reflection X‐ray fluorescence, TXRF system to determine optimum conditions for detecting certain elements of interest under various analytical conditions in a given ten‐element standard sample is presented in this paper. Results of these trial experiments show that the detectability of elements improved with increasing applied voltages up to about 43kV (for a Molybdenum anode TXRF spectrometer) and atomic number of elements. Variation of geometry such as the glancing incidence angle of the excitation beam reflected slight increase in minimum detection limit, MDL values as the angle of incidence is reduced from an optimum value of 1.6mradian to 1.0mradian. The nature of the sample support was observed to affect the detectability of the elements as good detection limits were obtained if gold is used as sample holder..

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Citation

Adejumo, O. and Ojo, J. (2007), "Optimizing the Operating Conditions of a Molybdenum Target Total Reflection X‐Ray Fluorescence (TXRF) Spectrometer Using a Computer Model", Multidiscipline Modeling in Materials and Structures, Vol. 3 No. 1, pp. 71-80. https://doi.org/10.1163/157361107781360121

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Emerald Group Publishing Limited

Copyright © 2007, Emerald Group Publishing Limited

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