Spectrometer gets the measure of PB contamination

Soldering & Surface Mount Technology

ISSN: 0954-0911

Article publication date: 1 December 2004

Citation

(2004), "Spectrometer gets the measure of PB contamination", Soldering & Surface Mount Technology, Vol. 16 No. 3. https://doi.org/10.1108/ssmt.2004.21916cad.008

Publisher

:

Emerald Group Publishing Limited

Copyright © 2004, Emerald Group Publishing Limited


Spectrometer gets the measure of PB contamination

Spectrometer gets the measure of PB contamination

The new Fischer Instrumentation (GB) XRF pin diode spectrometer is a novel instrument promises accurate assessment of lead contamination as a quality-assurance measure in compliance with the RoHS and WEEE Directives. The Fischer XRF pin diode spectrometer can measure with good accuracy, contamination in the 0.02-0.05 per cent range. This means the instrument can prove that the lead content is below the mandatory level, rather than simply showing that lead contamination is present.

For a brochure or catalogue on this product, please email mail@fischergb.co.uk