New micro grabbers for fine pitch IC testing

Soldering & Surface Mount Technology

ISSN: 0954-0911

Article publication date: 1 April 2000

Keywords

Citation

(2000), "New micro grabbers for fine pitch IC testing", Soldering & Surface Mount Technology, Vol. 12 No. 1. https://doi.org/10.1108/ssmt.2000.21912aad.013

Publisher

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Emerald Group Publishing Limited

Copyright © 2000, MCB UP Limited


New micro grabbers for fine pitch IC testing

New micro grabbers for fine pitch IC testing

Keywords: Warwick Test Supplies, Grabbing

A new family of micro SMD grabber test clips, designed for testing fine pitch IC packages, is available from Warwick Test Supplies (Plate 7). Manufactured by Pomona Electronics, the clips are ideal for prototype design and debugging applications. Three grabber styles are offered: both short and long tip for 0.8mm to 0.5mm lead pitches and one for lead pitches as small as 0.3mm. Small yet easy to handle, they can be used with virtually any fine pitch IC including QFP, PQFP, SSOP and TSOP and TSSOP packages.

Plate 7Pomona's new micro-grabbers for fine pitch IC testing

The new grabbers offer a cost-effective and versatile solution when compared to higher priced multi-contact test clips. Unlike multi-contact clips, which are limited to a single package style, they can be used on a variety of ICs and, if a specific test clip is not readily available, the grabbers can be quickly attached to any IC lead, eliminating the need for labour intensive and potentially destructive soldering.

The micro SMD grabber's ultra-thin body design allows for side-by-side stacking for adjacent lead probing, the pincer tips being Teflon insulated to guard against shorting. All styles can be used at frequencies up to 100MHz and are supplied with flying leads for logic analyser attachment.

For further information please contact: Warwick Test Supplies. Tel: +44 (0) 1926 851007 ; Fax: +44 (0) 1926 851588.