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Emerald Group Publishing Limited
Copyright © 2003, MCB UP Limited
Awards for Excellence
Awards for Excellence
Mark J. RobinsonDavid W. Armitage and John P. OakleyUMIST Manchester, UK
are the recipients of the journal's Outstanding Paper Award for Excellence for their paper
"Seeing in the mist: real time video enhancement"
which appeared in Sensor Review, Vol. 22 No. 2, 2002
Mark Robinson received his first degree in Physics from UMIST, and a PhD from Manchester University in 1994, for his work in using machine vision for industrial inspection tasks. He then joined a company involved in the design of scientific CCD cameras for astronomy applications, but maintained close links with the university. He returned to UMIST to conduct a Research Associate position to investigate the real-time defogging of video. He is now a senior vision engineer in Simulation Solutions Ltd, a company specialising in providing advanced machine vision inspection tools to the glass industry.
David W. Armitage received his BSc and PhD degrees at the University College of North Wales (Bangor) within the School of Electronic Engineering Science. He continued there as a research officer investigating radiofrequency induced hyperthermia for the treatment of cancer. He is currently a lecturer in the Department of Electrical Engineering and Electronics at UMIST and a member of the Image Engineering and Neural Computing research group. He is a member of the Institute of Navigation and his current research interests include video image enhancement in adverse visibility conditions and novel GPS based tomographic imaging systems.
John Peter Oakley (BSc, University of Warwick 1975; MSc, Brunel University 1984; PhD, University of Manchester 1987) is a senior lecturer in the Department of Electrical Engineering and Electronics at UMIST. His research interests are in image processing and optics, with particular emphasis on techniques for the mitigation of contrast loss due to scattering. Dr Oakley has a strong record of innovative work and holds several international patents. He is a member of both the IEE and the IEEE and has recently been appointed to the editorial board of Sensor Review.