Optical Measurement Techniques and Applications

Sensor Review

ISSN: 0260-2288

Article publication date: 1 December 1998

384

Citation

(1998), "Optical Measurement Techniques and Applications", Sensor Review, Vol. 18 No. 4. https://doi.org/10.1108/sr.1998.08718dae.001

Publisher

:

Emerald Group Publishing Limited

Copyright © 1998, MCB UP Limited


Optical Measurement Techniques and Applications

Optical Measurement Techniques and Applications

Edited by P.K. RastogiArtech House1997433 pp.ISBN 0-89006-516-0£69.00

Promoted as a single source of up to date knowledge over a broad spectrum of topics in the rapidly advancing field of optical metrology, this book is a collection of chapters from a number of different authors working across the relevant disciplines. The material is presented at a variety of different levels, from the basic equations and concepts, through real world applications, to the detailed description of a number of contemporary techniques.

The 14 densely packed chapters are generally either dedicated to an isolated technique or an overview of the general practice within a particular field of optical metrology. An approachable introduction to the subject by the editor forms the first chapter and gives the uninitiated a brief grounding in the fundamental properties of light that are exploited within the techniques of later chapters. More general chapters follow, covering interferometry including holography, speckle photography and a chapter dedicated to the application of Moiré methods and photoelasticity. A general overview of the uses of fibre optic sensors precedes a chapter dedicated to their use in the relatively new field of smart sensors for various engineering structures. The remaining chapters are more specific in nature, relating to holography within dynamic volumes, particle image velocimetry, surface roughness measurement and remote sensing with Lidar. The final, multiple-authored chapter comprises brief outlines of other optical metrology topics, including optical caustics, digital image correlation in planar displacement and ellipsometry.

The book is aimed at a high undergraduate/postgraduate level, and might be used as either a reference or an advanced introduction into the field, each chapter being liberally referenced. Some topics are covered to a greater depth than others and the book would be of use to both practising researchers and engineers, offering objective appraisal of methods, in addition to an insight into the current capabilities of optical metrology.

Paul Abbott

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