Bringing chemical analysis to SEM

Citation

(2003), "Bringing chemical analysis to SEM", Pigment & Resin Technology, Vol. 32 No. 4. https://doi.org/10.1108/prt.2003.12932dab.002

Bringing chemical analysis to SEM

Bringing chemical analysis to SEM

Keywords: Chemical analysis, Spectroscopy, Materials

Renishaw has announced its new structural and chemical analyser, incorporating Raman, photoluminescence (PL), and cathodoluminescence (CL) spectroscopies directly within the scanning electron microscope (SEM) sample chamber. Combining these techniques with elemental spectroscopy (EDS), transforms the SEM into a powerful materials characterisation tool. This major analytical instrumentation advance is the result of a long standing co-operation between Renishaw and a number of SEM manufacturers.

The new product can be fitted to most makes and models of SEM. Renishaw has been supplying high-end analytical tools to the Japanese market through the JEOL network for nearly a decade. JEOL is, therefore, a natural choice for the first showing of the high-vacuum version of the structural and chemical analyser at PittCon on 10 March.

Ken Williams, Renishaw’s Sales and Marketing Manager for spectroscopy products, states: “This is the result of an intensive development project which has added a new dimension to the analysis of materials viewed by an SEM. We have already had many initial enquiries and pre-launch orders from chemists, physicists, and material scientists keen to implement the new technology.” Charlie Nielsen of JEOL comments: “This new combination of spectroscopies, adding Raman to EDS, offers the analyst a complementary technique that reveals information on chemical state not currently available. It also allows accurate identification of organic and polymeric materials not possible with just EDS.”