Particle analysis SEM launched

Pigment & Resin Technology

ISSN: 0369-9420

Article publication date: 1 April 2000




(2000), "Particle analysis SEM launched", Pigment & Resin Technology, Vol. 29 No. 2.



Emerald Group Publishing Limited

Copyright © 2000, MCB UP Limited

Particle analysis SEM launched

Particle analysis SEM launched

Keywords: Hitachi, Particles analysis, Microscopes

A new particle analysis scanning electron microscope has been announced by Hitachi Scientific Instruments. Developed in collaboration with Oxford Instruments, this new system is known as the Hitachi-Oxford particle analyser (HOPASEM), and is available exclusively from Hitachi.

Consisting of an S-3000 series SEM, with fully integrated energy dispersive X-ray analyser, back-scattered electron detector, motorised stage and automated beam control, the HOPASEM features sophisticated control software for completely automated particle analysis. It is reported that up to 500 particles per hour can be analysed.

With samples mounted on a purpose-built holder, particles are detected using the back-scattered electron signal, and are classified by deconvolved peak areas. A full elemental analysis is carried out on each particle.

Information is clearly displayed on the monitor, with separate windows for batch details, particle information and elemental and shape information for the selected particle. A single click allows individual particles to be relocated.

A comprehensive reporting system is provided, with a variety of reports generated from a single click of the mouse. Report formats include class summary report, confirmed particle report, summary report and full particle list. All results can be exported to Excel ™ for further analysis if required.

Details available from: Hitachi Scientific Instruments. Tel: +44 (0) 118 932 8632; Fax:+44 (0) 118 932 8779; Website: http//

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