TY  - JOUR
AB  - 
VL  - 29
IS  - 2
SN  - 1356-5362
DO  - 10.1108/mi.2012.21829baa.021
UR  - https://doi.org/10.1108/mi.2012.21829baa.021
PY  - 2012
Y1  - 2012/01/01
TI  - Multitest MEMS test and calibration equipment now available for MT9510 pick-and-place test handler
T2  - Microelectronics International
PB  - Emerald Group Publishing Limited
Y2  - 2024/04/19
ER  -