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Emerald Group Publishing Limited
Copyright © 2012, Emerald Group Publishing Limited
Camtek launches Xact200 and receives first PO from a leading semiconductor player
Article Type: New products From: Microelectronics International, Volume 29, Issue 2
Camtek have announced the first sale of its newly launched Xact200: the second generation of its revolutionary Transmission Electron Microscope (TEM)/STEM sample preparation system for the semiconductor industry. The purchase order was from a leading semiconductor company in Asia.
Shrinking feature dimensions and advances in material complexity require a scale of analysis only possible through TEM processes. The Xact200 performs cutting-edge TEM sample preparation bringing an innovative and significant advantage to customers that are currently using traditional Focused Ion Beam (FIB) technology. The Xact200 enables sample preparation for the 2X node and even the 1X node achieving a very high success rate.
“The Xact200 is an additional step in our penetration into the sample preparation market. In only a few weeks since its release, we have already seen strong demand and this initial PO symbolizes the potential of this product line,” commented Roy Porat, Camtek’s CEO. “In 2011, this business made a solid contribution to our top line and we believe that the new Xact200 will allow us to grow this business even further”.