TY  - JOUR
AB  - 
VL  - 28
IS  - 3
SN  - 1356-5362
DO  - 10.1108/mi.2011.21828caa.010
UR  - https://doi.org/10.1108/mi.2011.21828caa.010
AU  - Ling John
PY  - 2011
Y1  - 2011/01/01
TI  - IEEE Workshop on Reliability & Safety Supported by iMAPS UK and NMI University of GreenwichLondon14 April 2011
T2  - Microelectronics International
PB  - Emerald Group Publishing Limited
Y2  - 2024/04/23
ER  -