IEEE Workshop on Reliability & Safety Supported by iMAPS UK and NMI University of GreenwichLondon14 April 2011

Microelectronics International

ISSN: 1356-5362

Publication date: 2 August 2011

Abstract

Citation

Ling, J. (2011), "IEEE Workshop on Reliability & Safety Supported by iMAPS UK and NMI University of GreenwichLondon14 April 2011", Microelectronics International, Vol. 28 No. 3. https://doi.org/10.1108/mi.2011.21828caa.010

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Emerald Group Publishing Limited

Copyright © 2011, Emerald Group Publishing Limited

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