Geotest expands PXI digital product line with two new high-performance digital instruments

Microelectronics International

ISSN: 1356-5362

Article publication date: 25 January 2011

119

Citation

(2011), "Geotest expands PXI digital product line with two new high-performance digital instruments", Microelectronics International, Vol. 28 No. 1. https://doi.org/10.1108/mi.2011.21828aad.004

Publisher

:

Emerald Group Publishing Limited

Copyright © 2011, Emerald Group Publishing Limited


Geotest expands PXI digital product line with two new high-performance digital instruments

Article Type: New products From: Microelectronics International, Volume 28, Issue 1

Geotest has recently expanded its digital test product line with the introduction of the GX5295 and GX5960 PXI digital instruments.

The GX5295 offers the highest performance and most features of any 3U PXI dynamic digital I/O board on the market and provides a cost-effective solution for semiconductor test applications. The GX5295 features a per-channel parametric measurement unit (PMU) and high-performance pin electronics supporting a programmable drive/sense voltage range from −2 V to+7 V – providing both analogue and digital test capabilities in a single module. Each card offers 32 bidirectional, 100 MHz digital channels with up to 256 digital channels being supported in one timing domain.

Geotest’s GX5960 50 MHz digital subsystem represents a new level of capabilities and performance for PXI digital instrumentation. Based on the EADS T964 VXI module and offering equivalent functionality as well as additional capabilities, the GX5960 features programmable high-voltage pin electronics (−10 V to+15 V) and a high-performance timing generator/sequencer with 256 time sets and 1 ns per pin timing resolution.

The compact 6U PXI form factor offers a cost effective, compact form factor without sacrificing performance for system, board and component test applications. In addition, the GX5960 offers a per-channel PMU and analogue bus access for each I/O channel – providing hybrid channel (digital or analogue) measurement capabilities. Two module configurations are available – the 32 channel GX5964 or the 16 channel GX5961 which offers guided probe support and static high voltage I/O.

Both the GX5295 and GX5960 are supplied with the DIOEasy software package, which provides vector editing/display and file import utilities, a virtual instrument panel and 32-bit DLL driver libraries.

The GX5295 is available from 15 October and the GX5960 digital subsystem from 1 November and will be presented for the first time in Europe at electronica 2010.

Further information is available at: www.geotest.com

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