Citation
(2011), "Camtek receives order for multiple wafer inspection systems", Microelectronics International, Vol. 28 No. 1. https://doi.org/10.1108/mi.2011.21828aab.008
Publisher
:Emerald Group Publishing Limited
Copyright © 2011, Emerald Group Publishing Limited
Camtek receives order for multiple wafer inspection systems
Article Type: Industry news From: Microelectronics International, Volume 28, Issue 1
Camtek received follow-on order for multiple wafer inspection systems from a major Asian integrated device maker (IDM). The systems will be installed during the third and fourth quarters of 2010.
The order, totaling over $3 million dollars, includes several systems for 2-D and 3-D inspection and metrology of bumped wafers.
Mr Roy Porat, Camtek’s General Manager, commented: “Leading IDMs continue to select Camtek’s Falcon systems as part of their QA process, to ensure the delivery of top quality products to their end-users. This order represents the confidence that our customers have in Camtek, as a leading provider of state of the art technology for 2D & 3D inspection and metrology for all applications including, the very demanding, TSV and micro-bump applications.”
Mr Porat added: “We are very pleased with this order and will make all efforts to continue providing the right solutions to meet our customers’ inspection requirements along with our usual top quality customer service and support.” To find out more, visit: www.camtek.co.il