TY  - JOUR
AB  - 
VL  - 27
IS  - 1
SN  - 1356-5362
DO  - 10.1108/mi.2010.21827aaa.001
UR  - https://doi.org/10.1108/mi.2010.21827aaa.001
PY  - 2010
Y1  - 2010/01/01
TI  - Measuring the impact of research
T2  - Microelectronics International
PB  - Emerald Group Publishing Limited
Y2  - 2024/04/20
ER  -