TY  - JOUR
AB  - 
VL  - 26
IS  - 2
SN  - 1356-5362
DO  - 10.1108/mi.2009.21826bad.011
UR  - https://doi.org/10.1108/mi.2009.21826bad.011
PY  - 2009
Y1  - 2009/01/01
TI  - Aries Electronics’ new 6.5 mm centre probe test socket features versatile design ideal for test and burn-in
T2  - Microelectronics International
PB  - Emerald Group Publishing Limited
Y2  - 2024/09/24
ER  -