TY - JOUR AB - VL - 24 IS - 3 SN - 1356-5362 DO - 10.1108/mi.2007.21824cab.007 UR - https://doi.org/10.1108/mi.2007.21824cab.007 PY - 2007 Y1 - 2007/01/01 TI - Tests prove reliability of "chip-on-board" technology T2 - Microelectronics International PB - Emerald Group Publishing Limited Y2 - 2024/03/28 ER -