TY  - JOUR
AB  - 
VL  - 23
IS  - 1
SN  - 1356-5362
DO  - 10.1108/mi.2006.21823aac.001
UR  - https://doi.org/10.1108/mi.2006.21823aac.001
PY  - 2006
Y1  - 2006/01/01
TI  - MeasComp/Sensors “Auf Wiedersehen” in Nürnberg
T2  - Microelectronics International
PB  - Emerald Group Publishing Limited
Y2  - 2024/04/18
ER  -