Keywords
Citation
(2005), "New high resolution measurement system automates inspection of production samples", Microelectronics International, Vol. 22 No. 1. https://doi.org/10.1108/mi.2005.21822aad.005
Publisher
:Emerald Group Publishing Limited
Copyright © 2005, Emerald Group Publishing Limited
New high resolution measurement system automates inspection of production samples
New high resolution measurement system automates inspection of production samples
Keywords: Automation, Inspection, Measurement
VMS-G1 is the new, low cost visual measurement system from Envisage Systems, which is designed to replace the manual inspection, by microscope, of components such as capacitors, diodes, resistors, inductors, sensors, varistors, thermistors, multiple chip arrays and semiconductors, during the production process. The system gives an extremely high level of repeatability and accuracy to the testing of batch processes and produces batch reports automatically (see Plate 1).
Plate
1 The new VMS-G1 from Envisage Systems
VMS-G1 is a camera-based system, which measures to a repeatable accuracy every time and stores the data for as long as required, without the problems of long-term storage of paper-based results. A measurement script creator allows the user to easily create an instruction script that guides the operator through the inspection process, via on-screen instructions, ensuring that similar results are always obtained. Results are automatically compared with data contained within an internal database containing the exact specifications of the component.
For more information, visit the Web site: www.envisagesystems.co.uk