Keywords
Citation
(2003), "FEINFOCUS and Palomar Technologies collaborate", Microelectronics International, Vol. 20 No. 3. https://doi.org/10.1108/mi.2003.21820cab.012
Publisher
:Emerald Group Publishing Limited
Copyright © 2003, MCB UP Limited
FEINFOCUS and Palomar Technologies collaborate
FEINFOCUS and Palomar Technologies collaborate
Keywords: Palomar Technologies
FEINFOCUS USA and Palomar Technologies have teamed to address the unique manufacturing challenges of the optoelectronics, MEMS/MOEMS, and RF components markets. Palomar's process development and prototyping services (PDPS) will use the FEINFOCUS FOX- 160.25MFT X-ray inspection system for the inspection of advanced components, materials, and packaging technologies. The companies will also publish joint technical papers on their findings with regards to process development, testing, and manufacturing of optoelectronics and micro-mechanical components and assemblies.
This relationship with FEINFOCUS will give Palomar the ability to conduct real-time inspection of complex assemblies that include chip-on-board, bond wires, BGA, µBGA, and flip-chip components, as well as other applications where exceptionally precise measurement is required. The FEINFOCUS FOX inspection system offers sub-micron defect detection and the smallest focal spot size in the industry. Having won the 2001 Vision Award for Best New Inspection Product, the FOX-160.25 has proven to be a valuable asset for any production facility or lab environment.
Palomar's PDPS provides the design, engineering, prototyping, assembly and automation expertise, and/or metrology resources needed to bridge the gap between product concept and automated production for companies looking to develop or validate new products.