TY  - JOUR
AB  - 
VL  - 17
IS  - 2
SN  - 1356-5362
DO  - 10.1108/mi.2000.21817bad.010
UR  - https://doi.org/10.1108/mi.2000.21817bad.010
PY  - 2000
Y1  - 2000/01/01
TI  - Mini-Systems resistors qualify for Life Failure Rate R
T2  - Microelectronics International
PB  - Emerald Group Publishing Limited
Y2  - 2024/05/07
ER  -