Dage launches new low-force wire pull tester

Microelectronics International

ISSN: 1356-5362

Article publication date: 1 April 2000

Keywords

Citation

(2000), "Dage launches new low-force wire pull tester", Microelectronics International, Vol. 17 No. 1. https://doi.org/10.1108/mi.2000.21817aad.014

Publisher

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Emerald Group Publishing Limited

Copyright © 2000, MCB UP Limited


Dage launches new low-force wire pull tester

Dage launches new low-force wire pull tester

Keywords: Dage, Testing

Aimed primarily at production testing applications in the semiconductor industry, the new SERIES-3000 low-force wire pull tester from Dage Precision Industries builds on the success and acceptance of the company's SERIES-4000 multi-function bond tester (Plate 7).

Using the same ergonomic design principals, and simplicity of operation and interface, as the innovative SERIES-4000, the basic SERIES-3000 system configuration allows testing to 100g, with a 1 kg option available.

Plate 7Dage series 3000 low-force wire pull tester

The SERIES-3000 incorporates a basic on-board analysis capability, which as well as providing information such as Mean, Max, Min, SD, and range, also offers the facility to programme an LSL for true CPK calculations. In addition the system has an RS232 output for data transfer to an external PC.

Driven by an internal PC processor, the SERIES-3000 combines the push button ease of use of the more traditional EPROM systems, with the power and flexibility of modern PC driven equipment.