Sonoscan introduces time-saving STAR module

Microelectronics International

ISSN: 1356-5362

Article publication date: 1 December 1999

106

Keywords

Citation

(1999), "Sonoscan introduces time-saving STAR module", Microelectronics International, Vol. 16 No. 3. https://doi.org/10.1108/mi.1999.21816cad.008

Publisher

:

Emerald Group Publishing Limited

Copyright © 1999, MCB UP Limited


Sonoscan introduces time-saving STAR module

Sonoscan introduces time-saving STAR module

Keywords Sonoscan, Imaging

Simultaneous thru-scan and reflection (STAR scan) technology has been introduced by Sonoscan, the developer and maker of acoustic micro imaging systems (Plate 5). The time-saving module performs both Thru-scan and reflection-mode imaging during the same scan.

Thru-scan imaging, long popular with users of Sonoscan C-SAM® systems for quick spotting of internal defects, uses a transducer on either side of the sample. The top transducer pulses very high frequency ultrasound into the sample; the bottom transducer reads the exiting ultrasound. Gap-type defects (cracks, delaminations, disbonds) block ultrasound from reaching the bottom transducer. The image shows internal structure and the acoustic shadow of the defect ­ but not its depth.

Plate 5STAR system

Reflection-mode imaging, by contrast, uses a single topside transducer which pulses ultrasound and receives return echoes. Internal features and defects are imaged, but the varying arrival time of return echoes indicates their depth.

Thru-scan imaging tells a failure analyst that a defect is present, while reflection-mode imaging tells the analyst the defect's vertical position. STAR makes it unnecessary for the analyst to lose time by switching from one mode to the other and having to flip the sample over to rescan it.

In a plastic integrated circuit (IC) package, the die attach might be delaminated from the top side of the die paddle ­ a serious defect. Alternatively, molding compound might be delaminated from the bottom side of the die paddle ­ a less troublesome anomaly. Using the two-mode STAR system, the analyst can: tell that a defect exists; and instantly evaluate its location and significance.

For more information about the STAR module, contact Steven R. Martell, Technical Marketing Manager, Sonoscan, Inc., 2149 East Pratt Blvd, Elk Grove Village, IL 60007, USA. Tel: +1 630 766 7088; Fax: +1 630 766 4603; E-mail: info@sonoscan.com

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