Diary

Industrial Robot

ISSN: 0143-991x

Publication date: 1 February 2000

Citation

(2000), "Diary", Industrial Robot, Vol. 27 No. 1. https://doi.org/10.1108/ir.2000.04927aac.001

Publisher

:

Emerald Group Publishing Limited

Copyright © 2000, MCB UP Limited


Diary

Conferences & Exhibitions

Key: C = Conference, E = Exhibition, S = Seminar, W = Workshop

2000

BI-MU (E) Machine Tools, Robots, Automation

23-26 FebruaryLevante, ItalyRaffaella Antinori. Tel: (+39) 0226 255 244; E-mail: bimued.esp@ucimu.it; WWW: www.fieradellevante.it/bimumed.htm

Hannover Fair 2000 (E)

20-25 MarchHannover, Germany

Automation & Robotics 2000 (C + E) MACH 2000 Design for Manufacture SubCon 2000 Welding & Metal Fabrication Engineering Lasers IFPEX

10-13 April/b>NEC, Birmingham, UKPhil Binding, BARA. Tel (+44) 121 628 1745; E-mail: bara@globalnet.co.uk

2000 IEEE Int. Conf. Robotics and Automation (C)

24-28 AprilSan Francisco, California, USAProfessor Oussama Khatib, Department of CS, Stanford University, Stanford, CA 94505, USA. Tel: (+1) 650 725 9753; Fax: (+1) 650 725 1449; E-mail: icra2000@robotics.stanford.edu

Materials Testing 2000 (E)

9-11 MayNEC, Birmingham, UKCindy Bailey, BINDT, 1 Spencer Parade, Northampton NN1 5AA, UK. Tel: (+44) 1604 630 124; Fax: (+44) 1604 231 489; E-mail: mt2000@bindt.org

ISR 2000 (C + E) International Symposium on Robotics

14-17 MayMontreal, CanadaISR 2000 Secretariat, c/o Golden Planners, Inc., 401-126 York Street, Ottawa, Ontario, Canada, K1N 5T5. Tel: (+1) 613 241 9333; Fax: (+1) 613 565 2173; E-mail: gpi@ intranet.ca; WWW: www.precarn.ca/isr2000

WAC 2000 (C) World Automation Congress Robotics, Manufacturing, Control & Automation, Image Processing

11-16 JuneHawaii, USAWAC 2000 Secretariat, Jila Salari, PO Box 14126, Albuquerque, NM 87191-4126, USA. Tel: (+1) 505 298 5817; Fax: (+1) 505 291 0013; E-mail: wac@eece.unm.edu; WWW: http://ace.unm.edu/wac00

7th IFAC (S) Automated systems based on human skill

15-17 JuneAachen, GermanyVDI/VDE-GMA, POB 101139, D-40002, DÏsseldorf, Germany. Tel: (+49) 211 6214 215; Fax: (+49) 211 6214 161; E-mail: rosenzweig@vdi.de; WWW: http://www.vdi.de./gma/call-joint-design.htm

8th Int. Meeting on Chemical Sensors (C)

3-5 JulyBasel, SwitzerlandPhillipa Orme, IMCS 2000, 12 Church Street, West Hanney, Nr. Wantage, Oxon OX12 0LN, UK. Tel: (+44) 1235 868 811; Fax: (+44) 1235 868 811; E-mail: p.orme@dial.pipex.com

Control 2000 (C)

4-7 SeptemberCambridge, UKIEE Conference Services, Savoy Place, London WC2R 0BL, UK. Fax: (+44) 0207 240 8830; E-mail: control@iee.org.uk; WWW: http://iee.org.uk/Conf/Control

Mechatronics 2000 (C)

6-8 SeptemberAtlanta, Georgia, USAMechatronics 2000 Secretariat, IEE Conferences, Savoy Place, London WC2R 0BL, UK. Tel: (+44) 020 7344 5469; Fax: (+44) 020 7240 8839; E-mail: mechatronics2000@iee.org.uk; WWW: http://www.me.gatech.edu/mechatronics2000

Manufacturing 2000 (C)

6-13 SeptemberChicago, USASME Customer Service, One SME Drive, PO Box 930, Dearborn, MI 48121-0930, USA. Tel: (+1) 313 271 1500; Fax: (+1) 313 271 2861; WWW: http://www.sme.org

Mechatronics and Machine Vision in Practice 2000 (C)

19-21 SeptemberHervey Bay, Queensland, AustraliaE-mail: johnbill@usq.edu.au; WWW: http://www.usq.edu.au/users/billings/m2vip

CONVEYOREX (E)

26-29 SeptemberNEC, Birmingham, UKJan Thorpe, DMG Business Media. Tel: (+44) 1737 768 611.

IECON - 2000 (C) Industrial Electronics, Control and Instrumentation

22-28 OctoberNagoya, Aichi, JapanProfessor Toshio Fukuda, IECON 2000, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464-8603, Japan. Tel: (+81) 52 789 4478; Fax: (+81) 52 789 3909; E-mail: iecon2k@mein.nagoya-u.ac.jp; WWW: http://www.nuee.nagoya-u.ac.jp/institute/IECON2K/

If you would like further information about any of the conferences or exhibitions featured in the Diary Section, please contact the organisers for that particular event.

Editorial note: if you are aware of any local, national or international seminars, exhibitions or conferences, the Editor would be pleased to receive this information as early as possible in order to include it in this section of the journal.