TY  - JOUR
AB  - This paper presents experimental data associated with the properties of thick film thermistors based on a spinel‐type semiconducting oxide/RuO2/glass system. The following parameters—sheet resistivity, thermistor (B) and thermal time (?) constants—have been measured, all as functions of different composition and construction variants. The thermistor properties are independent of configuration and are mainly determined by the semiconducting oxide particle chains. The correlation between B and ? for the compositions considered has been observed.
VL  - 9
IS  - 2
SN  - 1356-5362
DO  - 10.1108/eb044568
UR  - https://doi.org/10.1108/eb044568
AU  - Golonka L.
AU  - Kozlowski J.
AU  - Licznerski B.W.
AU  - Nitsch K.
AU  - Seweryn A.
PY  - 1992
Y1  - 1992/01/01
TI  - Influence of Composition and Construction Parameters on the Basic Properties of Thick Film Thermistors
T2  - Microelectronics International
PB  - MCB UP Ltd
SP  - 9
EP  - 12
Y2  - 2024/04/25
ER  -