Excess Noise in Thick Film Resistors: Volume Dependence
A. Masoero
(Department of Physics, University of Modena, Modena, Italy)
B. Morten
(Department of Physics, University of Modena, Modena, Italy)
M. Tamborin
(Department of Physics, University of Modena, Modena, Italy)
M. Prudenziati
(Department of Physics, University of Modena, Modena, Italy)
69
Citation
Masoero, A., Morten, B., Tamborin, M. and Prudenziati, M. (1995), "Excess Noise in Thick Film Resistors: Volume Dependence", Microelectronics International, Vol. 12 No. 2, pp. 5-8. https://doi.org/10.1108/eb044556
Publisher
:Emerald Group Publishing Limited
Copyright © 1995, Emerald Group Publishing Limited