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A Conformal Mapping Analysis of Polygonal Planar Resistors with Curved Boundaries

M.A. Chaudhry (California State University, Fullerton, USA)
R. Schinzinger (Department of Electrical and Computer Engineering, University of California, Irvine, USA)

Microelectronics International

ISSN: 1356-5362

Article publication date: 1 January 1992

Abstract

Introduction of curved boundaries in polygonally shaped integrated circuit planar resistors causes a crease in maximum electric field intensities and current densities present in them, and consequently decreases the likelihood of their failure. The presence of curved boundaries can also decrease the area occupied by the resistor. Therefore, polygonal resistors with curved boundaries can be highly desirable in integrated circuits. Resistances of conductors with curved boundaries are readily computed using conformal mapping, particularly the numerically, extended Schwarz‐Christoffel transformation developed by the authors. The resulting algorithm is applicable to polygonal resistors of arbitrary shape and is easily programmable. Several examples are presented. Rapid convergence and accurate results are obtained.

Citation

Chaudhry, M.A. and Schinzinger, R. (1992), "A Conformal Mapping Analysis of Polygonal Planar Resistors with Curved Boundaries", Microelectronics International, Vol. 9 No. 1, pp. 21-27. https://doi.org/10.1108/eb044466

Publisher

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MCB UP Ltd

Copyright © 1992, MCB UP Limited