TY  - JOUR
AB  - It is of practical importance to measure and control the morphological state of thin film superconductors. Properties such as critical current, magnetic response and high frequency response are significantly affected by the microstructure of granular thin film specimens. A simple and functional method, magnetically modulated resistance, is described for assessing the granularity of superconductors.
VL  - 8
IS  - 1
SN  - 1356-5362
DO  - 10.1108/eb044433
UR  - https://doi.org/10.1108/eb044433
AU  - Kim B.F.
AU  - Bohandy J.
AU  - Adrian F.J.
AU  - Phillips T.E.
AU  - Moorjani K.
PY  - 1991
Y1  - 1991/01/01
TI  - Characterisation of Thin Film Superconductors by Magnetically Modulated Resistance
T2  - Microelectronics International
PB  - MCB UP Ltd
SP  - 16
EP  - 19
Y2  - 2024/09/21
ER  -