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Processing and Diagnostics for Thick Film Superconductors Produced from Y‐Ba‐Cu‐O Materials

J.S. Choi (Electrical and Computer Engineering Department, Drexel University, Philadelphia, Pennsylvania, USA)
M. Bhalodia (Electrical and Computer Engineering Department, Drexel University, Philadelphia, Pennsylvania, USA)
S. Samph (Electrical and Computer Engineering Department, Drexel University, Philadelphia, Pennsylvania, USA)
P. Snowden (Electrical and Computer Engineering Department, Drexel University, Philadelphia, Pennsylvania, USA)
P. Yahner (Electrical and Computer Engineering Department, Drexel University, Philadelphia, Pennsylvania, USA)
K.J. Scoles (Electrical and Computer Engineering Department, Drexel University, Philadelphia, Pennsylvania, USA)

Microelectronics International

ISSN: 1356-5362

Article publication date: 1 February 1989

23

Abstract

Thick film superconductors have been produced by screen printing and annealing pastes made from oxide powders and pre‐annealed powders. These films have been analysed by X‐ray diffraction, microwave absorption, resistance vs. temperature measurements, and adhesion tests. Results show the correlation between structural and electrical properties.

Citation

Choi, J.S., Bhalodia, M., Samph, S., Snowden, P., Yahner, P. and Scoles, K.J. (1989), "Processing and Diagnostics for Thick Film Superconductors Produced from Y‐Ba‐Cu‐O Materials", Microelectronics International, Vol. 6 No. 2, pp. 17-22. https://doi.org/10.1108/eb044367

Publisher

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MCB UP Ltd

Copyright © 1989, MCB UP Limited

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