Thick Film Resistors Not Only on Ceramics: How to Obtain Suitable Layout Parameters

Abstract

The square resistance of thick film resistors on dielectric layers can show a very complex behaviour. From resistance measurements of a test pattern three suitable paste parameters Q(L), M(L) and A(L) can be calculated as numerical functions of the resistor length L. All formulae needed for establishing an accurate resistor layout by means of the parameters are presented in this paper. The three‐dimensional surface of the square resistance as a function of length L and width W can also easily be calculated.

Citation

Stecher, G. (1988), "Thick Film Resistors Not Only on Ceramics: How to Obtain Suitable Layout Parameters", Microelectronics International, Vol. 5 No. 3, pp. 24-27. https://doi.org/10.1108/eb044339