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Economic Justification For Hybrid Substrate Testing

D.F. Crowley (Teledyne TAC, Woburn, Massachusetts, USA)

Microelectronics International

ISSN: 1356-5362

Article publication date: 1 March 1988

66

Abstract

This paper focuses on the economic justification for testing unpopulated hybrid substrates. The return on investment (ROI) for substrate testing is based on the high value added in material and labour after substrate fabrication. The data required to calculate the ROI on testing are presented. The factors influencing the selection of the test method are discussed.

Citation

Crowley, D.F. (1988), "Economic Justification For Hybrid Substrate Testing", Microelectronics International, Vol. 5 No. 3, pp. 22-23. https://doi.org/10.1108/eb044338

Publisher

:

MCB UP Ltd

Copyright © 1988, MCB UP Limited

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