TY  - JOUR
AB  - The rapid assessment of thick film resistor reliability is presented. This relies on the application of constant power pulses. The long‐term stability of the resistors is predicted on the basis of the value of the minimal destroyed power applied during the pulse. The results are compared with the long‐term behaviour of the tested samples.
VL  - 5
IS  - 2
SN  - 1356-5362
DO  - 10.1108/eb044323
UR  - https://doi.org/10.1108/eb044323
AU  - Golonka L.
AU  - Kozlowski J.
AU  - Nitsch K.
PY  - 1988
Y1  - 1988/01/01
TI  - Accelerated Life Test of Thick Film Resistors
T2  - Microelectronics International
PB  - MCB UP Ltd
SP  - 36
EP  - 38
Y2  - 2024/04/25
ER  -