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Accelerated Life Test of Thick Film Resistors

L. Golonka (Institute of Electron Technology, Technical University, Wroclaw, Poland)
J. Kozlowski (Institute of Electron Technology, Technical University, Wroclaw, Poland)
K. Nitsch (Institute of Electron Technology, Technical University, Wroclaw, Poland)

Microelectronics International

ISSN: 1356-5362

Publication date: 1 February 1988

Abstract

The rapid assessment of thick film resistor reliability is presented. This relies on the application of constant power pulses. The long‐term stability of the resistors is predicted on the basis of the value of the minimal destroyed power applied during the pulse. The results are compared with the long‐term behaviour of the tested samples.

Citation

Golonka, L., Kozlowski, J. and Nitsch, K. (1988), "Accelerated Life Test of Thick Film Resistors", Microelectronics International, Vol. 5 No. 2, pp. 36-38. https://doi.org/10.1108/eb044323

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Publisher

:

MCB UP Ltd

Copyright © 1988, MCB UP Limited

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