Accelerated Life Test of Thick Film Resistors
Article publication date: 1 February 1988
The rapid assessment of thick film resistor reliability is presented. This relies on the application of constant power pulses. The long‐term stability of the resistors is predicted on the basis of the value of the minimal destroyed power applied during the pulse. The results are compared with the long‐term behaviour of the tested samples.
Golonka, L., Kozlowski, J. and Nitsch, K. (1988), "Accelerated Life Test of Thick Film Resistors", Microelectronics International, Vol. 5 No. 2, pp. 36-38. https://doi.org/10.1108/eb044323
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