Accelerated Life Test of Thick Film Resistors
L. Golonka
(Institute of Electron Technology, Technical University, Wroclaw, Poland)
J. Kozlowski
(Institute of Electron Technology, Technical University, Wroclaw, Poland)
K. Nitsch
(Institute of Electron Technology, Technical University, Wroclaw, Poland)
32
Abstract
The rapid assessment of thick film resistor reliability is presented. This relies on the application of constant power pulses. The long‐term stability of the resistors is predicted on the basis of the value of the minimal destroyed power applied during the pulse. The results are compared with the long‐term behaviour of the tested samples.
Citation
Golonka, L., Kozlowski, J. and Nitsch, K. (1988), "Accelerated Life Test of Thick Film Resistors", Microelectronics International, Vol. 5 No. 2, pp. 36-38. https://doi.org/10.1108/eb044323
Publisher
:MCB UP Ltd
Copyright © 1988, MCB UP Limited