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The Justification of 100% Conductor Testing for Improved Yields

R. Hammershøj (Linkease Test Systems AS, Roskilde, Denmark)

Microelectronics International

ISSN: 1356-5362

Article publication date: 1 March 1986

22

Abstract

Automatic thickfilm conductor testing performed as a 100% test gives a number of advantages if used correctly and well adjusted to the real needs. Though improved yield in production is the essential benefit of automatic test, a number of advantages and perspectives reach other company divisions outside the thickfilm production area. A number of general guidelines help to define the need and calculate the justification figures for a given production. The quality of the test process itself, however, can be an important part of the calculations.

Citation

Hammershøj, R. (1986), "The Justification of 100% Conductor Testing for Improved Yields", Microelectronics International, Vol. 3 No. 3, pp. 24-26. https://doi.org/10.1108/eb044244

Publisher

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MCB UP Ltd

Copyright © 1986, MCB UP Limited

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