To read this content please select one of the options below:

Influence of Trimming on the Electric Field Distribution in Thick Film Resistors

G. Casselman (Ghent State University, Ghent, Belgium)
G. De Mey (Ghent State University, Ghent, Belgium)

Microelectronics International

ISSN: 1356-5362

Article publication date: 1 April 1985

14

Abstract

A finite difference method is presented to calculate the potential distribution in a trimmed resistor. The numerical results are used to study the influence of trimming on the power density distribution and the noise performance.

Citation

Casselman, G. and De Mey, G. (1985), "Influence of Trimming on the Electric Field Distribution in Thick Film Resistors", Microelectronics International, Vol. 2 No. 4, pp. 10-12. https://doi.org/10.1108/eb044192

Publisher

:

MCB UP Ltd

Copyright © 1985, MCB UP Limited

Related articles